受强制性开放获取政策约束的文章 - Shu-han Hsu了解详情
无法在其他位置公开访问的文章：2 篇
Optimal accelerated test framework for time-dependent dielectric breakdown lifetime parameter estimation
YD Wu, K Yang, SH Hsu, L Milor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (12 …, 2020
强制性开放获取政策： US Department of Defense
Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators
SH Hsu, YY Huang, YD Wu, K Yang, LH Lin, L Milor
Microelectronics Reliability 114, 113753, 2020
强制性开放获取政策： US National Science Foundation
可在其他位置公开访问的文章：4 篇
Machine learning for detection of competing wearout mechanisms
SH Hsu, K Yang, L Milor
2019 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2019
强制性开放获取政策： US National Science Foundation
Reliability and accelerated testing of 14nm FinFET ring oscillators
SH Hsu, K Yang, L Milor
2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS), 1-7, 2019
强制性开放获取政策： US National Science Foundation
Extraction of wearout model parameters using on-line test of an SRAM
SH Hsu, YY Huang, YD Wu, K Yang, LH Lin, L Milor
Microelectronics Reliability 114, 113756, 2020
强制性开放获取政策： US National Science Foundation
Identification of failure modes for circuit samples with confounded causes of failure
S Hsu, YY Huang, K Yang, L Milor
2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019
强制性开放获取政策： US National Science Foundation
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