关注
Yeongil Noh
Yeongil Noh
Samsung Display Co., Ltd.
在 samsung.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
The validation study of the body shape questionnaire (BSQ) in female university students
YK Noh, BW Kim
The Korea Journal of Counseling 6 (4), 1163-1174, 2005
172005
Predictive control of the plasma processes in the OLED display mass production referring to the discontinuity qualifying PI-VM
S Park, Y Jang, T Cha, Y Noh, Y Choi, J Lee, J Seong, B Kim, T Cho, ...
Physics of Plasmas 27 (8), 2020
142020
Application of PI-VM for management of the metal target plasma etching processes in OLED display manufacturing
S Park, T Cho, Y Jang, Y Noh, Y Choi, T Cha, J Lee, B Kim, JH Yang, ...
Plasma Physics and Controlled Fusion 61 (1), 014032, 2018
122018
Plasma information-based virtual metrology (PI-VM) and mass production process control
S Park, J Seong, Y Jang, HJ Roh, JW Kwon, J Lee, S Ryu, J Song, ...
Journal of the Korean Physical Society 80 (8), 647-669, 2022
112022
Cause analysis of the faults in HARC etching processes by using the PI‐VM model for OLED display manufacturing
S Park, Y Kyung, J Lee, Y Jang, T Cha, Y Noh, Y Choi, B Kim, T Cho, ...
Plasma Processes and Polymers 16 (9), 1900030, 2019
112019
Welding behavior between Zn-coated steel plate and free cutting carbon steel rod by Nd: YAG laser beam
YT Noh, BC Kim
Journal of KSLP 4, 30-39, 2001
72001
Micro-range uniformity control of the etching profile in the OLED display mass production referring to the PI-VM model
S Park, J Seong, Y Noh, Y Park, Y Jang, T Cho, JH Yang, GH Kim
Physics of Plasmas 28 (10), 2021
62021
Data-driven plasma science based plasma etching process design in OLED mass production referring to PI-VM
S Park, J Seong, Y Park, Y Noh, H Lee, N Bae, KB Roh, R Seo, B Song, ...
Plasma Physics and Controlled Fusion 66 (2), 025014, 2024
12024
PI (Plasma Information) 인자 모니터링을 통한 dry etch process chamber 상태 정량화 및 공정제어 알고리즘 기반 연구
장용석, 노연길, 차태원, 이주영, 박설혜
한국진공학회 학술발표회초록집, 181-181, 2018
2018
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