| Multi-probe atomic force microscopy using piezoelectric cantilevers N Satoh, E Tsunemi, Y Miyato, K Kobayashi, S Watanabe, T Fujii, ... Japanese Journal of Applied Physics 46 (8S), 5543, 2007 | 27 | 2007 |
| Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip K Kaisei, N Satoh, K Kobayashi, K Matsushige, H Yamada Nanotechnology 22 (17), 175301, 2011 | 25 | 2011 |
| Dynamic-mode AFM using the piezoelectric cantilever: investigations of local optical and electrical properties N Satoh, K Kobayashi, S Watanabe, T Fujii, T Horiuchi, H Yamada, ... Applied surface science 188 (3-4), 425-429, 2002 | 22 | 2002 |
| Multi-probe atomic force microscopy with optical beam deflection method E Tsunemi, N Satoh, Y Miyato, K Kobayashi, K Matsushige, H Yamada Japanese Journal of Applied Physics 46 (8S), 5636, 2007 | 21 | 2007 |
| Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever N Satoh, K Kobayashi, S Watanabe, T Fujii, T Horiuchi, H Yamada, ... Japanese journal of applied physics 42 (7S), 4878, 2003 | 21 | 2003 |
| Apparatus and method of obtaining field by measurement K Kimura, K Kobayashi, H Yamada, K Matsushige, T Horiuchi, N Satoh, ... US Patent 8,536,862, 2013 | 20 | 2013 |
| Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy T Uruma, N Satoh, H Yamamoto Japanese Journal of Applied Physics 55 (8S1), 08NB10, 2016 | 19 | 2016 |
| Nanoscale investigation of the silicon carbide double-diffused MOSFET with scanning capacitance force microscopy M Nakajima, Y Uchida, N Satoh, H Yamamoto Japanese Journal of Applied Physics 57 (8S1), 08NB09, 2018 | 11 | 2018 |
| Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy T Uruma, N Satoh, H Yamamoto Japanese Journal of Applied Physics 56 (8S1), 08LB05, 2017 | 10 | 2017 |
| Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy A Doi, M Nakajima, S Masuda, N Satoh, H Yamamoto Japanese Journal of Applied Physics 58 (SI), SIIA04, 2019 | 9 | 2019 |
| Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever N Satoh, T Fukuma, K Kobayashi, S Watanabe, T Fujii, K Matsushige, ... Applied Physics Letters 96 (23), 2010 | 9 | 2010 |
| A flyback converter using power MOSFET to achieve high frequency operation beyond 13.56 MHz N Satoh, H Otake, T Nakamura, T Hikihara IECON 2015-41st Annual Conference of the IEEE Industrial Electronics Society …, 2015 | 8 | 2015 |
| Investigations of nanoparticles by scanning near-field optical microscopy combined with Kelvin probe force microscopy using a piezoelectric cantilever N Satoh, K Kobayashi, S Watanabe, T Fujii, T Horiuchi, H Yamada, ... Japanese journal of applied physics 43 (7S), 4651, 2004 | 8 | 2004 |
| Driven by complementary operation of SiC-MOSFET and SiC-JFET within isolated flyback converter circuit N Satoh, T Hayashi, T Ohsato, H Arai, Y Nishida Nonlinear Theory and Its Applications, IEICE 9 (3), 337-343, 2018 | 7 | 2018 |
| Energy Band Diagram near the Interface of Aluminum Oxide on p-Si Fabricated by Atomic Layer Deposition without/with Rapid Thermal Cycle Annealing Determined by Capacitance … N Satoh, I Cesar, M Lamers, I Romijn, K Bakker, C Olson, DO Saynova, ... e-Journal of Surface Science and Nanotechnology 10, 22-28, 2012 | 7 | 2012 |
| Surface Potential Measurement of Tris (8-hydroxyquinolinato) aluminum and Bis [N-(1-naphthyl)-N-phenyl] benzidine Thin Films Fabricated on Indium–Tin Oxide by Kelvin Probe … S Katori, N Satoh, M Yahiro, K Kobayashi, H Yamada, K Matsushige, ... Japanese Journal of Applied Physics 50 (7R), 071601, 2011 | 7 | 2011 |
| Stress reduction and structural quality improvement due to In doping in GaAs/Si S Saravanan, M Adachi, N Satoh, T Soga, T Jimbo, M Umeno Materials Science and Engineering: B 68 (3), 166-170, 2000 | 7 | 2000 |
| Evaluation of renal function by dynamic CT N Satoh, I Togami, K Murakami, T Kitagawa, S Kimoto, Y Hiraki, S Uno, ... Nihon Igaku Hoshasen Gakkai zasshi. Nippon Acta Radiologica 51 (11), 1346-1351, 1991 | 7 | 1991 |
| Studies of an aspect of renal function with the aid of dynamic CT and renogram. N Satoh, S Kimoto, Y Hiraki Acta Medica Okayama 45 (3), 187-193, 1991 | 7 | 1991 |
| Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy H Yamamoto, K Agui, Y Uchida, S Mochizuki, T Uruma, N Satoh, ... Japanese Journal of Applied Physics 56 (8S1), 08LB07, 2017 | 6 | 2017 |
