Sanz JM 个人学术档案 - 学术资源搜索

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	总计	2019 年至今
引用	4975	843
h 指数	39	14
i10 指数	102	24

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合著作者

Leonardo SorianoProfessor in Applied Physics在 uam.es 的电子邮件经过验证
Pilar Prieto RecioUniversidad Autónoma de Madrid在 uam.es 的电子邮件经过验证
Agustin R. Gonzalez-ElipeResearch Professor of CSIC at the Instituto de Ciencia de Mataeriales de Sevilla在 icmse.csic.es 的电子邮件经过验证
Asuncion FernandezInstituto de Ciencias de Materiales de Sevilla, CSIC在 icmse.csic.es 的电子邮件经过验证
Francisco YuberoTenured scientist在 icmse.csic.es 的电子邮件经过验证
Miguel AbbateDepartamento de Fisica, Universidade Federal do Parana在 fisica.ufpr.br 的电子邮件经过验证
Francisco M Marquez LinaresFull Professor of Chemistry, University of Turabo-Universidad AGM, PR, USA在 uagm.edu 的电子邮件经过验证
Kleber Roberto PirotaProfessor, Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas (Unicamp)在 ifi.unicamp.br 的电子邮件经过验证
Sven TougaardProfessor of physics, University of Southern Denmark在 sdu.dk 的电子邮件经过验证
Alejandro GutierrezProfessor of Applied Physics, Universidad Autonoma de Madrid在 uam.es 的电子邮件经过验证
maurizio sacchiCNRS - Institut des NanoSciences de Paris在 synchrotron-soleil.fr 的电子邮件经过验证
G. MunueraUniv Seville - Spain在 us.es 的电子邮件经过验证
J.F. MarcoInstituto de Química Física Blas Cabrera在 iqfr.csic.es 的电子邮件经过验证
Marta ClementUniversidad Politécnica de Madrid. Grupo de Microsistemas y Materiales Electrónicos在 etsit.upm.es 的电子邮件经过验证
Jan VogelCNRS senior research scientist, Institut Néel, Grenoble在 neel.cnrs.fr 的电子邮件经过验证
JC Sanchez LopezInvestigador Científico CSIC, Instituto de Ciencia de Materiales de Sevilla (CSIC-US)在 icmse.csic.es 的电子邮件经过验证
Jean Michel MartinUniversité de Lyon, Ecole Centrale de Lyon在 ec-lyon.fr 的电子邮件经过验证
H A PadmoreLawrence Berkekely National Lab在 lbl.gov 的电子邮件经过验证
Alfonso CaballeroUniversidad de Sevilla在 us.es 的电子邮件经过验证
Anton P.J. StampflPhysicist, Australian Nuclear Science and Technology Organisation在 ansto.gov.au 的电子邮件经过验证

关注

Sanz JM

retired Applied Physics Department Universidad Autónoma de Madrid

在 uam.es 的电子邮件经过验证

surface Analysis materials science coatings


标题按引用次数排序按年份排序按标题排序	引用次数引用次数	年份
An XPS study of the interaction of oxygen with zirconium C Morant, JM Sanz, L Galan, L Soriano, F Rueda Surface Science 218 (2-3), 331-345, 1989	366	1989
Preferential sputtering of oxides: A comparison of model predictions with experimental data JB Malherbe, S Hofmann, JM Sanz Applied surface science 27 (3), 355-365, 1986	299	1986
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence F Yubero, JM Sanz, B Ramskov, S Tougaard Physical Review B 53 (15), 9719, 1996	205	1996
An XPS study of the initial stages of oxidation of hafnium C Morant, L Galan, JM Sanz Surface and interface Analysis 16 (1‐12), 304-308, 1990	142	1990
Electron inelastic mean free path for Ti, TiC, TiN and TiO₂ as determined by quantitative reflection electron energy‐loss spectroscopy GG Fuentes, E Elizalde, F Yubero, JM Sanz Surface and Interface Analysis: An International Journal devoted to the …, 2002	139	2002
XPS characterization of nitrogen‐doped carbon nanotubes C Morant, J Andrey, P Prieto, D Mendiola, JM Sanz, E Elizalde physica status solidi (a) 203 (6), 1069-1075, 2006	136	2006
Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systems: A comparative study AR González-Elipe, G Munuera, JP Espinos, JM Sanz Surface Science 220 (2-3), 368-380, 1989	113	1989
Ar-ion bombardment effects on surfaces C Morant, JM Sanz, L Galan Physical Review B 45 (3), 1391, 1992	104	1992
Auger electron spectroscopy and X-ray photoelectron spectroscopy studies of the oxidation of polycrystalline tantalum and niobium at room temperature and low oxygen pressures JM Sanz, S Hofmann Journal of the Less Common Metals 92 (2), 317-327, 1983	102	1983
Dielectric loss function of Si and SiO₂ from quantitative analysis of REELS spectra F Yubero, S Tougaard, E Elizalde, JM Sanz Surface and interface analysis 20 (8), 719-726, 1993	100	1993
Low energy ion assisted film growth A Gonzalez-elipe, JM Sanz, F Yubero World Scientific, 2003	90	2003
The O 1s x-ray absorption spectra of transition-metal oxides: The TiO2− ZrO2− HfO2 and V2O5− Nb2O5− Ta2O5 series L Soriano, M Abbate, JC Fuggle, MA Jimenez, JM Sanz, C Mythen, ... Solid state communications 87 (8), 699-703, 1993	86	1993
Chemical changes induced by sputtering in TiO2 and some selected titanates as observed by X-ray absorption spectroscopy L Soriano, M Abbate, J Vogel, JC Fuggle, A Fernández, ... Surface science 290 (3), 427-435, 1993	84	1993
Quantitative evaluation of AES‐depth profiles of thin anodic oxide films (Ta₂O₅/Ta, Nb₂O₅/Nb) JM Sanz, S Hofmann Surface and interface analysis 5 (5), 210-216, 1983	79	1983
The statistical sputtering contribution to resolution in concentration-depth profiles MP Seah, JM Sanz, S Hofmann Thin Solid Films 81 (3), 239-246, 1981	78	1981
The electronic structure of mesoscopic NiO particles L Soriano, M Abbate, J Vogel, JC Fuggle, A Fernández, ... Chemical physics letters 208 (5-6), 460-464, 1993	76	1993
Electronic structure of stoichiometric and -bombarded determined by resonant photoemission C Morant, A Fernandez, AR Gonzalez-Elipe, L Soriano, A Stampfl, ... Physical Review B 52 (16), 11711, 1995	75	1995
Thermal oxidation of TiN studied by means of soft x‐ray absorption spectroscopy L Soriano, M Abbate, JC Fuggle, P Prieto, C Jiménez, JM Sanz, L Galán, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11 (1 …, 1993	70	1993
Synthesis and characterization of monodisperse magnetite hollow microspheres F Márquez, T Campo, M Cotto, R Polanco, R Roque, P Fierro, JM Sanz, ... Soft Nanoscience Letters 1 (02), 25-32, 2011	69	2011
Electronic structure of insulating zirconium nitride P Prieto, L Galan, JM Sanz Physical Review B 47 (3), 1613, 1993	66	1993

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