Sebastian Stach 个人学术档案

引用次数

	总计	2019 年至今
引用	2137	1106
h 指数	30	21
i10 指数	50	43

280

140

210

20032004200520062007200820092010201120122013201420152016201720182019202020212022202320247 9 12 24 21 21 32 23 10 14 18 76 172 208 198 170 218 268 235 200 119 66

开放获取的出版物数量

查看全部

1 篇文章

可查看的文章

无法查看的文章

根据资助方的强制性开放获取政策

合著作者

Ștefan ȚăluUniversitatea Tehnică din Cluj-Napoca, Direcția pentru Managementul Cercetării, Dezvoltării şi在 auto.utcluj.ro 的电子邮件经过验证
Żaneta Garczyk-MundałaInstitute of Biomedical Engineering | Faculty of Science and Technology | Univeristy of Silesia在 us.edu.pl 的电子邮件经过验证
Stanisław RoskoszFaculty of Materials Engineering, Silesian University of Technology在 polsl.pl 的电子邮件经过验证
Mihai Talu在 edu.ucv.ro 的电子邮件经过验证
Seyed Mohammad ElahiProfessor of physics, science and research Branch, Islamic Azad University在 srbiau.ac.ir 的电子邮件经过验证
Atefeh GhaderiQuantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University在 alzahra.ac.ir 的电子邮件经过验证
Shahram SolaymaniHead of Quantum Technologies Research Center, Science and Research Branch, Islamic Azad University在 srbiau.ac.ir 的电子邮件经过验证
Zygmunt WróbelUniveristy of Silesia在 us.edu.pl 的电子邮件经过验证
Wiktoria SapotaBiomedical Engineering and Materials Science and Engineering, University of Silesia在 us.edu.pl 的电子邮件经过验证
Dr. Dinesh Pathak Ph. D. PDF (Europe)Univerzita Pardubice, Europe ; Queens University Canada ; University of West Indies; GNDU, India在 upce.cz 的电子邮件经过验证
Joanna MaszybrockaUniversity of Silesia in Katowice, Institute of Materials Science在 us.edu.pl 的电子邮件经过验证
Carlos Luna CriadoUniversidad Autónoma de Nuevo León (UANL), Facultad de Ciencias Físico Matemáticas (FCFM), CICFiM在 uanl.edu.mx 的电子邮件经过验证
Nader GhobadiPhysics Department, Faculty of Science, Malayer University, Malayer, Iran在 malayeru.ac.ir 的电子邮件经过验证
Rostam Moradianprofessor of physics, Razi University, Kermanshah, Iran在 razi.ac.ir 的电子邮件经过验证
Asja ČelebićStomatološki fakultet Sveučilišta u Zagrebu在 sfzg.hr 的电子邮件经过验证
Negin Beryani NezafatPostdoc, University of Duisburg-Essen在 uni-due.de 的电子邮件经过验证
Aman MahajanProfessor in Physics, Guru Nanak Dev University, Amritsar在 gndu.ac.in 的电子邮件经过验证
Dr. Anshul Kumar SharmaDepartment of Higher Education, Govt. of Himachal Pradesh/Guru Nanak Dev University, Amritsar在 gndu.ac.in 的电子邮件经过验证
Grzegorz DerczInstitute of Materials Engineering, Faculty of Science and Technology, University of Silesia在 us.edu.pl 的电子邮件经过验证
Zainuriah HassanUniversiti Sains Malaysia在 usm.my 的电子邮件经过验证

关注

Sebastian Stach

University of Silesia in Katowice, Faculty of Science and Technology, Institute of Biomedical

在 us.edu.pl 的电子邮件经过验证 - 首页

biomedical engineering fracture surface multifractal analysis confocal microscopy


标题按引用次数排序按年份排序按标题排序	引用次数引用次数	年份
AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates D Dallaeva, Ş Ţălu, S Stach, P Škarvada, P Tománek, L Grmela Applied Surface Science 312, 81-86, 2014	110	2014
Usefulness of 3D surface roughness parameters for nondestructive evaluation of pull-off adhesion of concrete layers J Hoła, Ł Sadowski, J Reiner, S Stach Construction and Building Materials 84, 111-120, 2015	101	2015
Characterization of ETL 9357FLA photomultiplier tubes for cryogenic temperature applications A Ankowski, M Antonello, P Aprili, F Arneodo, A Badertscher, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2006	79	2006
Multifractal description of fracture morphology: theoretical basis S Stach, J Cybo Materials characterization 51 (1), 79-86, 2003	79	2003
Stereometric parameters of the Cu/Fe NPs thin films S Stach, Z Garczyk, S Talu, S Solaymani, A Ghaderi, R Moradian, ... The Journal of Physical Chemistry C 119 (31), 17887-17898, 2015	77	2015
Morphological features in aluminum nitride epilayers prepared by magnetron sputtering S Stach, D Dallaeva, Ş Ţălu, P Kaspar, P Tománek, S Giovanzana, ... Materials Science-Poland 33 (1), 175-184, 2015	73	2015
Topographic characterization of Cu–Ni NPs@ aC: H films by AFM and multifractal analysis S Talu, S Stach, T Ghodselahi, A Ghaderi, S Solaymani, A Boochani, ... The Journal of Physical Chemistry B 119 (17), 5662-5670, 2015	69	2015
3-D surface stereometry studies of sputtered TiN thin films obtained at different substrate temperatures S Stach, W Sapota, Ş Ţălu, A Ahmadpourian, C Luna, N Ghobadi, ... Journal of Materials Science: Materials in Electronics 28, 2113-2122, 2017	68	2017
Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering Ş Ţǎlu, S Stach, S Valedbagi, SM Elahi, R Bavadi Materials Science-Poland 33 (1), 137-143, 2015	62	2015
Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness Ş Ţălu, S Stach, S Solaymani, R Moradian, A Ghaderi, MR Hantehzadeh, ... Journal of Electroanalytical Chemistry 749, 31-41, 2015	61	2015
Multifractal characterization of nanostructure surfaces of electrodeposited Ni-P coatings Ş Ţălu, S Stach, A Méndez, G Trejo, M Ţălu Journal of the Electrochemical Society 161 (1), D44, 2013	60	2013
Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution R Shikhgasan, Ţ Ştefan, S Dinara, S Sebastian, R Guseyn Superlattices and Microstructures 86, 395-402, 2015	58	2015
Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi Surface and Interface Analysis 46 (6), 393-398, 2014	57	2014
Multifractal characterization of water soluble copper phthalocyanine based films surfaces Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi, ... Electronic Materials Letters 10, 719-730, 2014	56	2014
Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation Ş Ţălu, Z Marković, S Stach, BT Marković, M Ţălu Applied Surface Science 289, 97-106, 2014	56	2014
Fracture surface--fractal or multifractal? S Stach, J Cybo, J Chmiela Materials Characterization 46 (2-3), 163-167, 2001	56	2001
Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al_0.08In_0.08Ga_0.84N thin film assessed by atomic force microscopy and fractal … Ş Ţălu, AJ Ghazai, S Stach, A Hassan, Z Hassan, M Ţălu Journal of Materials Science: Materials in Electronics 25, 466-477, 2014	54	2014
Multifractal characteristics of titanium nitride thin films Ş Ţălu, S Stach, S Valedbagi, R Bavadi, SM Elahi, M Ţălu Materials Science-Poland 33 (3), 541-548, 2015	53	2015
Surface roughness characterization of poly (methylmethacrylate) films with immobilized Eu (III) β-Diketonates by fractal analysis Ş Ţălu, S Stach, J Zaharieva, M Milanova, D Todorovsky, S Giovanzana International Journal of Polymer Analysis and Characterization 19 (5), 404-421, 2014	52	2014
Film thickness effect on fractality of tin-doped In₂O₃ thin films Ş Ţălu, S Stach, D Raoufi, F Hosseinpanahi Electronic Materials Letters 11, 749-757, 2015	51	2015

系统目前无法执行此操作，请稍后再试。

文章 1–20

每年引用数

重复的引用

合并的引用

添加合著者合著作者

上传 PDF

关注此作者

引用次数

合著作者

引用