Formation of the giant planets by concurrent accretion of solids and gas JB Pollack, O Hubickyj, P Bodenheimer, JJ Lissauer, M Podolak, ... icarus 124 (1), 62-85, 1996 | 3544 | 1996 |
Subsurface damage from helium ions as a function of dose, beam energy, and dose rate R Livengood, S Tan, Y Greenzweig, J Notte, S McVey Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 237 | 2009 |
Accretion rates of protoplanets: II. Gaussian distributions of planetesimal velocities Y Greenzweig, JJ Lissauer Icarus 100 (2), 440-463, 1992 | 174 | 1992 |
Accretion rates of protoplanets Y Greenzweig, JJ Lissauer Icarus 87 (1), 40-77, 1990 | 165 | 1990 |
Nebular gas drag and planetary accretion DM Kary, JJ Lissauer, Y Greenzweig Icarus 106 (1), 288-307, 1993 | 86 | 1993 |
Probe current distribution characterization technique for focused ion beam S Tan, R Livengood, Y Greenzweig, Y Drezner, D Shima Journal of Vacuum Science & Technology B 30 (6), 2012 | 44 | 2012 |
On pore size and fracture in gas-laden comet nuclei D Prialnik, U Egozi, A Bar-Nun, M Podolak, Y Greenzweig Icarus 106 (2), 499-507, 1993 | 44 | 1993 |
Focused ion beam metal deposition I Gavish, Y Greenzweig US Patent 6,492,261, 2002 | 42 | 2002 |
Characterization of damage induced by FIB etch and tungsten deposition in high aspect ratio vias Y Drezner, D Fishman, Y Greenzweig, A Raveh Journal of Vacuum Science & Technology B 29 (1), 2011 | 36 | 2011 |
Accretion of mass and spin angular momentum by a planet on an eccentric orbit JJ Lissauer, AF Berman, Y Greenzweig, DM Kary Icarus 127 (1), 65-92, 1997 | 35 | 1997 |
Helium ion microscope invasiveness and imaging study for semiconductor applications RH Livengood, Y Greenzweig, T Liang, M Grumski Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007 | 33 | 2007 |
Structural characterization of He ion microscope platinum deposition and sub-surface silicon damage Y Drezner, Y Greenzweig, D Fishman, E van Veldhoven, DJ Maas, ... Journal of Vacuum Science & Technology B 30 (4), 2012 | 31 | 2012 |
Current density profile characterization and analysis method for focused ion beam Y Greenzweig, Y Drezner, S Tan, RH Livengood, A Raveh Microelectronic Engineering 155, 19-24, 2016 | 29 | 2016 |
Three-dimensional theory of the free-electron laser. I. Gain and evolution of optical modes A Amir, Y Greenzweig Physical Review A 34 (6), 4809, 1986 | 27 | 1986 |
Wafer singulation in high volume manufacturing G Vakanas, G Chen, Y Greenzweig, E Li, S Voronov US Patent App. 12/324,692, 2010 | 25 | 2010 |
Focused ion beam deposition I Gavish, Y Greenzweig US Patent App. 10/632,582, 2004 | 23 | 2004 |
Simulating advanced focused ion beam nanomachining: A quantitative comparison of simulation and experimental results KT Mahady, S Tan, Y Greenzweig, A Raveh, PD Rack Nanotechnology 29 (49), 495301, 2018 | 21 | 2018 |
Monte Carlo simulations of nanoscale Ne+ ion beam sputtering: investigating the influence of surface effects, interstitial formation, and the nanostructural evolution K Mahady, S Tan, Y Greenzweig, R Livengood, A Raveh, P Rack Nanotechnology 28 (4), 045305, 2016 | 21 | 2016 |
Three-dimensional free electron laser gain and evolution of optical modes A Amir, Y Greenzweig Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1986 | 20 | 1986 |
Focused ion beam deposition I Gavish, Y Greenzweig US Patent 7,171,918, 2007 | 15* | 2007 |