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Yuval Greenzweig
Yuval Greenzweig
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标题
引用次数
引用次数
年份
Formation of the giant planets by concurrent accretion of solids and gas
JB Pollack, O Hubickyj, P Bodenheimer, JJ Lissauer, M Podolak, ...
icarus 124 (1), 62-85, 1996
35441996
Subsurface damage from helium ions as a function of dose, beam energy, and dose rate
R Livengood, S Tan, Y Greenzweig, J Notte, S McVey
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
2372009
Accretion rates of protoplanets: II. Gaussian distributions of planetesimal velocities
Y Greenzweig, JJ Lissauer
Icarus 100 (2), 440-463, 1992
1741992
Accretion rates of protoplanets
Y Greenzweig, JJ Lissauer
Icarus 87 (1), 40-77, 1990
1651990
Nebular gas drag and planetary accretion
DM Kary, JJ Lissauer, Y Greenzweig
Icarus 106 (1), 288-307, 1993
861993
Probe current distribution characterization technique for focused ion beam
S Tan, R Livengood, Y Greenzweig, Y Drezner, D Shima
Journal of Vacuum Science & Technology B 30 (6), 2012
442012
On pore size and fracture in gas-laden comet nuclei
D Prialnik, U Egozi, A Bar-Nun, M Podolak, Y Greenzweig
Icarus 106 (2), 499-507, 1993
441993
Focused ion beam metal deposition
I Gavish, Y Greenzweig
US Patent 6,492,261, 2002
422002
Characterization of damage induced by FIB etch and tungsten deposition in high aspect ratio vias
Y Drezner, D Fishman, Y Greenzweig, A Raveh
Journal of Vacuum Science & Technology B 29 (1), 2011
362011
Accretion of mass and spin angular momentum by a planet on an eccentric orbit
JJ Lissauer, AF Berman, Y Greenzweig, DM Kary
Icarus 127 (1), 65-92, 1997
351997
Helium ion microscope invasiveness and imaging study for semiconductor applications
RH Livengood, Y Greenzweig, T Liang, M Grumski
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007
332007
Structural characterization of He ion microscope platinum deposition and sub-surface silicon damage
Y Drezner, Y Greenzweig, D Fishman, E van Veldhoven, DJ Maas, ...
Journal of Vacuum Science & Technology B 30 (4), 2012
312012
Current density profile characterization and analysis method for focused ion beam
Y Greenzweig, Y Drezner, S Tan, RH Livengood, A Raveh
Microelectronic Engineering 155, 19-24, 2016
292016
Three-dimensional theory of the free-electron laser. I. Gain and evolution of optical modes
A Amir, Y Greenzweig
Physical Review A 34 (6), 4809, 1986
271986
Wafer singulation in high volume manufacturing
G Vakanas, G Chen, Y Greenzweig, E Li, S Voronov
US Patent App. 12/324,692, 2010
252010
Focused ion beam deposition
I Gavish, Y Greenzweig
US Patent App. 10/632,582, 2004
232004
Simulating advanced focused ion beam nanomachining: A quantitative comparison of simulation and experimental results
KT Mahady, S Tan, Y Greenzweig, A Raveh, PD Rack
Nanotechnology 29 (49), 495301, 2018
212018
Monte Carlo simulations of nanoscale Ne+ ion beam sputtering: investigating the influence of surface effects, interstitial formation, and the nanostructural evolution
K Mahady, S Tan, Y Greenzweig, R Livengood, A Raveh, P Rack
Nanotechnology 28 (4), 045305, 2016
212016
Three-dimensional free electron laser gain and evolution of optical modes
A Amir, Y Greenzweig
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1986
201986
Focused ion beam deposition
I Gavish, Y Greenzweig
US Patent 7,171,918, 2007
15*2007
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