| Nanoindentation investigation of HfO2 and Al2O3 films grown by atomic layer deposition K Tapily, JE Jakes, DS Stone, P Shrestha, D Gu, H Baumgart, ... Journal of The Electrochemical Society 155 (7), H545, 2008 | 128 | 2008 |
| Ultrafast measurements of polarization switching dynamics on ferroelectric and anti-ferroelectric hafnium zirconium oxide M Si, X Lyu, PR Shrestha, X Sun, H Wang, KP Cheung, PD Ye Applied Physics Letters 115 (7), 2019 | 100 | 2019 |
| First direct measurement of sub-nanosecond polarization switching in ferroelectric hafnium zirconium oxide X Lyu, M Si, PR Shrestha, KP Cheung, PD Ye 2019 IEEE International Electron Devices Meeting (IEDM), 15.2. 1-15.2. 4, 2019 | 79 | 2019 |
| Resistive switching nanodevices based on metal–organic frameworks Z Wang, D Nminibapiel, P Shrestha, J Liu, W Guo, PG Weidler, ... ChemNanoMat 2 (1), 67-73, 2016 | 77 | 2016 |
| Precise control of highly ordered arrays of nested semiconductor/metal nanotubes D Gu, H Baumgart, K Tapily, P Shrestha, G Namkoong, X Ao, F Müller Nano Research 4, 164-170, 2011 | 41 | 2011 |
| Probing Charge Recombination Dynamics in Organic Photovoltaic Devices under Open‐Circuit Conditions LCC Elliott, JI Basham, KP Pernstich, PR Shrestha, LJ Richter, ... Advanced Energy Materials 4 (15), 1400356, 2014 | 37 | 2014 |
| First Direct Experimental Studies of Hf0.5Zr0.5O2 Ferroelectric Polarization Switching Down to 100-picosecond in Sub-60mV/dec Germanium Ferroelectric … W Chung, M Si, PR Shrestha, JP Campbell, KP Cheung, DY Peide 2018 IEEE Symposium on VLSI Technology, 89-90, 2018 | 32 | 2018 |
| Electron spin resonance scanning probe spectroscopy for ultrasensitive biochemical studies JP Campbell, JT Ryan, PR Shrestha, Z Liu, C Vaz, JH Kim, V Georgiou, ... Analytical chemistry 87 (9), 4910-4916, 2015 | 28 | 2015 |
| An Ultra-fast Multi-level MoTe2-based RRAM F Zhang, H Zhang, PR Shrestha, Y Zhu, K Maize, S Krylyuk, A Shakouri, ... 2018 IEEE International Electron Devices Meeting (IEDM), 22.7. 1-22.7. 4, 2018 | 26 | 2018 |
| Investigation of Volmer-Weber growth during the nucleation phase of ALD platinum thin films and template based platinum nanotubes P Shrestha, D Gu, N Tran, K Tapily, H Baumgart, G Namkoong ECS Transactions 33 (2), 127, 2010 | 26 | 2010 |
| Scalable microresonators for room-temperature detection of electron spin resonance from dilute, sub-nanoliter volume solids N Abhyankar, A Agrawal, P Shrestha, R Maier, RD McMichael, ... Science advances 6 (44), eabb0620, 2020 | 25 | 2020 |
| Recent advances in microresonators and supporting instrumentation for electron paramagnetic resonance spectroscopy N Abhyankar, A Agrawal, J Campbell, T Maly, P Shrestha, V Szalai Review of Scientific Instruments 93 (10), 2022 | 22 | 2022 |
| Ferroelectricity in Polar Polymer‐Based FETs: A Hysteresis Analysis V Georgiou, D Veksler, JP Campbell, PR Shrestha, JT Ryan, DE Ioannou, ... Advanced functional materials 28 (10), 1705250, 2018 | 22 | 2018 |
| Characteristics of resistive memory read fluctuations in endurance cycling DM Nminibapiel, D Veksler, PR Shrestha, JH Kim, JP Campbell, JT Ryan, ... IEEE Electron Device Letters 38 (3), 326-329, 2017 | 22 | 2017 |
| Analysis and control of RRAM overshoot current PR Shrestha, DM Nminibapiel, JP Campbell, JT Ryan, D Veksler, ... IEEE transactions on electron devices 65 (1), 108-114, 2017 | 20 | 2017 |
| Impact of RRAM read fluctuations on the program-verify approach DM Nminibapiel, D Veksler, PR Shrestha, JP Campbell, JT Ryan, ... IEEE Electron Device Letters 38 (6), 736-739, 2017 | 19 | 2017 |
| Experimental study of ALD HfO2 deposited on strained silicon-on-insulator and standard SOI D Gu, K Tapily, P Shrestha, MY Zhu, G Celler, H Baumgart Journal of the Electrochemical Society 155 (6), G129, 2008 | 18 | 2008 |
| Toward reliable RRAM performance: macro-and micro-analysis of operation processes G Bersuker, D Veksler, DM Nminibapiel, PR Shrestha, JP Campbell, ... Journal of Computational Electronics 16, 1085-1094, 2017 | 17 | 2017 |
| Wafer-level electrically detected magnetic resonance: Magnetic resonance in a probing station DJ McCrory, MA Anders, JT Ryan, PR Shrestha, KP Cheung, ... IEEE Transactions on Device and Materials Reliability 18 (2), 139-143, 2018 | 14 | 2018 |
| Slow-and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station DJ McCrory, MA Anders, JT Ryan, PR Shrestha, KP Cheung, ... Review of Scientific Instruments 90 (1), 2019 | 13 | 2019 |
HELMUT BAUMGARTOld Dominion University在 odu.edu 的电子邮件经过验证
