Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces T Glatzel, S Sadewasser Springer-Verlag Berlin Heidelberg, 2012 | 301* | 2012 |
Amplitude or frequency modulation-detection in Kelvin probe force microscopy T Glatzel, S Sadewasser, MC Lux-Steiner Applied Surface Science 210 (1), 84-89, 2003 | 280 | 2003 |
Kelvin probe force microscopy of semiconductor surface defects Y Rosenwaks, R Shikler, T Glatzel, S Sadewasser Physical Review B 70 (8), 085320, 2004 | 248 | 2004 |
Pressure dependence of T c to 17 GPa with and without relaxation effects in superconducting YBa 2 Cu 3 O x S Sadewasser, JS Schilling, AP Paulikas, BW Veal Physical Review B 61 (1), 741, 2000 | 201 | 2000 |
High-resolution work function imaging of single grains of semiconductor surfaces S Sadewasser, T Glatzel, M Rusu, A Jäger-Waldau, MC Lux-Steiner Applied physics letters 80 (16), 2979-2981, 2002 | 185 | 2002 |
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors S Sadewasser, P Jelinek, CK Fang, O Custance, Y Yamada, Y Sugimoto, ... Physical review letters 103 (26), 266103, 2009 | 184 | 2009 |
Incorporation of alkali metals in chalcogenide solar cells PMP Salomé, H Rodriguez-Alvarez, S Sadewasser Solar Energy Materials and Solar Cells 143, 9-20, 2015 | 164 | 2015 |
Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices S Sadewasser, T Glatzel, S Schuler, S Nishiwaki, R Kaigawa, ... Thin Solid Films 431, 257-261, 2003 | 164 | 2003 |
Heavy Alkali Treatment of Cu(In,Ga)Se2 Solar Cells: Surface versus Bulk Effects S Siebentritt, E Avancini, M Bär, J Bombsch, E Bourgeois, S Buecheler, ... Advanced Energy Materials 10 (8), 1903752, 2020 | 142 | 2020 |
Correct height measurement in noncontact atomic force microscopy S Sadewasser, MC Lux-Steiner Physical review letters 91 (26), 266101, 2003 | 137 | 2003 |
CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum T Glatzel, D Fuertes Marrón, T Schedel-Niedrig, S Sadewasser, ... Applied physics letters 81 (11), 2017-2019, 2002 | 131 | 2002 |
Direct evidence for grain boundary passivation in Cu(In,Ga)Se2 solar cells through alkali-fluoride post-deposition treatments N Nicoara, R Manaligod, P Jackson, D Hariskos, W Witte, G Sozzi, ... Nature communications 10 (1), 3980, 2019 | 129 | 2019 |
Evidence for a neutral grain-boundary barrier in chalcopyrites S Siebentritt, S Sadewasser, M Wimmer, C Leendertz, T Eisenbarth, ... Physical review letters 97 (14), 146601, 2006 | 116 | 2006 |
Texture and electronic activity of grain boundaries in Cu (In, Ga) Se {sub 2} thin films G Hanna, U Rau, JH Werner, T Glatzel, S Sadewasser, N Ott, HP Strunk | 111 | 2006 |
Texture and electronic activity of grain boundaries in Cu(In,Ga)Se2 thin films G Hanna, T Glatzel, S Sadewasser, N Ott, HP Strunk, U Rau, JH Werner Applied Physics A: Materials Science & Processing 82 (1), 1-7, 2006 | 111 | 2006 |
Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function T Glatzel, S Sadewasser, R Shikler, Y Rosenwaks, MC Lux-Steiner Materials Science and Engineering: B 102 (1), 138-142, 2003 | 107 | 2003 |
Introduction of Si PERC Rear Contacting Design to Boost Efficiency of Cu(In,Ga)Se Solar Cells B Vermang, JT Wätjen, C Frisk, V Fjällström, F Rostvall, M Edoff, ... IEEE Journal of Photovoltaics 4 (6), 1644-1649, 2014 | 97 | 2014 |
Effect of the KF post-deposition treatment on grain boundary properties in Cu (In, Ga) Se2 thin films N Nicoara, T Lepetit, L Arzel, S Harel, N Barreau, S Sadewasser Scientific Reports 7, 41361, 2017 | 96 | 2017 |
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation S Sadewasser, T Glatzel, R Shikler, Y Rosenwaks, MC Lux-Steiner Applied Surface Science 210 (1), 32-36, 2003 | 95 | 2003 |
Electrical activity at grain boundaries of Cu (In, Ga) Se 2 thin films DF Marrón, S Sadewasser, A Meeder, T Glatzel, MC Lux-Steiner Physical Review B 71 (3), 033306, 2005 | 94 | 2005 |