| A comprehensive time-dependent dielectric breakdown lifetime simulator for both traditional CMOS and FinFET technology K Yang, T Liu, R Zhang, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (11 …, 2018 | 20 | 2018 |
| A comparison study of time-dependent dielectric breakdown for analog and digital circuit's optimal accelerated test regions K Yang, T Liu, R Zhang, L Milor 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2017 | 10 | 2017 |
| Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown R Zhang, T Liu, K Yang, L Milor 2017 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2017 | 10 | 2017 |
| Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits K Yang, T Liu, R Zhang, DH Kim, L Milor Microelectronics Reliability 76, 81-86, 2017 | 10 | 2017 |
| SRAM stability analysis and performance–reliability tradeoff for different cache configurations R Zhang, T Liu, K Yang, CC Chen, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (3), 620-633, 2020 | 8 | 2020 |
| Modeling of FinFET SRAM array reliability degradation due to electromigration R Zhang, KX Yang, TZ Liu, L Milor Microelectronics Reliability 100, 113485, 2019 | 8 | 2019 |
| Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology K Yang, T Liu, R Zhang, L Milor 2018 IEEE 36th VLSI Test Symposium (VTS), 1-6, 2018 | 8 | 2018 |
| Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations R Zhang, T Liu, K Yang, L Milor Microelectronics Reliability 76, 87-91, 2017 | 8 | 2017 |
| Modeling for SRAM reliability degradation due to gate oxide breakdown with a compact current model R Zhang, T Liu, K Yang, L Milor 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 1-5, 2017 | 7 | 2017 |
| Impact of stress acceleration on mixed-signal gate oxide lifetime K Yang, L Milor 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW), 1-6, 2015 | 7 | 2015 |
| A library based on deep neural networks for modeling the degradation of FinFET SRAM performance metrics due to aging R Zhang, Z Liu, K Yang, T Liu, W Cai, L Milor Microelectronics Reliability 100, 113486, 2019 | 6 | 2019 |
| Impact of front-end wearout mechanisms on FinFET SRAM soft error rate R Zhang, Z Liu, K Yang, T Liu, W Cai, L Milor Microelectronics Reliability 100, 113487, 2019 | 6 | 2019 |
| A lifetime and power sensitive design optimization framework for a radio frequency circuit K Yang, T Liu, R Zhang, L Milor 2017 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2017 | 6 | 2017 |
| CacheEM: For reliability analysis on cache memory aging due to electromigration R Zhang, T Liu, K Yang, L Milor IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 5 | 2021 |
| Impact of front-end wearout mechanisms on the performance of a ring oscillator-based thermal sensor R Zhang, K Yang, T Liu, L Milor 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces …, 2019 | 5 | 2019 |
| Machine learning for detection of competing wearout mechanisms SH Hsu, K Yang, L Milor 2019 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2019 | 5 | 2019 |
| Estimation of the optimal accelerated test region for FinFET SRAMs degraded by front-end and back-end wearout mechanisms R Zhang, K Yang, T Liu, L Milor 2018 Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2018 | 5 | 2018 |
| A comprehensive framework for analysis of time-dependent performance-reliability degradation of SRAM cache memory R Zhang, K Yang, Z Liu, T Liu, W Cai, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (5), 857-870, 2021 | 4 | 2021 |
| Inverse design of finFET SRAM cells R Zhang, Z Liu, K Yang, T Liu, W Cai, L Milor 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 3 | 2020 |
| Reliability and accelerated testing of 14nm FinFET ring oscillators SH Hsu, K Yang, L Milor 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS), 1-7, 2019 | 3 | 2019 |
Rui ZhangGeorgia Institute of Technology在 gatech.edu 的电子邮件经过验证
Rui ZhangGeorgia Institute of Technology在 gatech.edu 的电子邮件经过验证
Taizhi LiuGeorgia Institute of Technology在 gatech.edu 的电子邮件经过验证
Dae-Hyun KimSamsung Electronics在 samsung.com 的电子邮件经过验证