| Band gap and defect states of MgO thin films investigated using reflection electron energy loss spectroscopy S Heo, E Cho, HI Lee, GS Park, HJ Kang, T Nagatomi, P Choi, BD Choi AIP Advances 5 (7), 2015 | 113 | 2015 |
| Double layer SiNx: H films for passivation and anti-reflection coating of c-Si solar cells J Ko, D Gong, K Pillai, KS Lee, M Ju, P Choi, KR Kim, J Yi, B Choi Thin solid films 519 (20), 6887-6891, 2011 | 43 | 2011 |
| Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement S Heo, JG Chung, HI Lee, J Lee, JB Park, E Cho, KH Kim, SH Kim, ... Scientific Reports 6 (1), 30554, 2016 | 34 | 2016 |
| Band alignment of atomic layer deposited (HfZrO4) 1− x (SiO2) x gate dielectrics on Si (100) S Heo, D Tahir, JG Chung, JC Lee, KH Kim, J Lee, HI Lee, GS Park, ... Applied Physics Letters 107 (18), 2015 | 28 | 2015 |
| A study on the electrical characteristic analysis of c-Si solar cell diodes P Choi, H Kim, D Baek, BD Choi JSTS: Journal of Semiconductor Technology and Science 12 (1), 59-65, 2012 | 22 | 2012 |
| The effects of valence band offset on threshold voltage shift in a-InGaZnO TFTs under negative bias illumination stress H Kim, K Im, J Park, T Khim, H Hwang, S Kim, S Lee, M Song, P Choi, ... IEEE Electron Device Letters 41 (5), 737-740, 2020 | 20 | 2020 |
| Effect of ALD- and PEALD- Grown Al2O3 Gate Insulators on Electrical and Stability Properties for a-IGZO Thin-Film Transistor J Park, H Kim, P Choi, B Jeon, J Lee, C Oh, B Kim, B Choi Electronic Materials Letters 17, 299-306, 2021 | 19 | 2021 |
| Dielectric properties of solution-processed ZrO2 for thin-film transistors J Cho, P Choi, N Lee, S Kim, B Choi Journal of Nanoscience and Nanotechnology 16 (10), 10380-10384, 2016 | 18 | 2016 |
| Effects of polyimide curing on image sticking behaviors of flexible displays H Kim, J Park, S Bak, J Park, C Byun, C Oh, BS Kim, C Han, J Yoo, D Kim, ... Scientific Reports 11 (1), 21805, 2021 | 16 | 2021 |
| New method for reduction of the capacitor leakage failure rate without changing the capacitor structure or materials in DRAM mass production JM Lee, PH Choi, SK Kim, JH Oh, SH Shin, JY Noh, HS Kim, BD Choi IEEE Transactions on Electron Devices 65 (11), 4839-4845, 2018 | 11 | 2018 |
| Fabrication and characteristics of high mobility InSnZnO thin film transistors P Choi, J Lee, H Park, D Baek, J Lee, J Yi, S Kim, B Choi Journal of Nanoscience and Nanotechnology 16 (5), 4788-4791, 2016 | 11 | 2016 |
| Conduction band offset-dependent induced threshold voltage shifts in a-InGaZnO TFTs under positive bias illumination stress H Kim, S Kim, J Yoo, C Oh, B Kim, H Hwang, J Park, P Choi, J Song, K Im, ... AIP Advances 11 (3), 2021 | 9 | 2021 |
| Investigation of the charge balance in green phosphorescent organic light-emitting diodes by controlling the mixed host emission layer J Lee, P Choi, M Kim, K Lim, Y Hyeon, S Kim, K Koo, S Kim, B Choi Journal of Nanoscience and Nanotechnology 18 (9), 5908-5912, 2018 | 9 | 2018 |
| Preparation and characterization of P-type and N-type doped expanded graphite polymer composites for thermoelectric applications R Javadi, PH Choi, HS Park, BD Choi Journal of Nanoscience and Nanotechnology 15 (11), 9116-9119, 2015 | 9 | 2015 |
| Analysis of the electrical properties of an electron injection layer in Alq3-based organic light emitting diodes S Kim, P Choi, S Kim, H Park, D Baek, S Kim, B Choi Journal of Nanoscience and Nanotechnology 16 (5), 4742-4745, 2016 | 8 | 2016 |
| Performance degradation of c-Si solar cells under UV exposure H Kim, P Choi, K Kim, H Kuh, D Beak, J Lee, J Yi, B Choi Journal of nanoscience and nanotechnology 14 (5), 3561-3563, 2014 | 8 | 2014 |
| Evaluation of minority carrier generation lifetime for oxide semiconductors P Choi, S Lee, H Kim, J Park, B Choi Thin Solid Films 704, 138023, 2020 | 7 | 2020 |
| Enhanced efficiency of multicrystalline silicon solar cells made via UV laser texturing PH Choi, JM Kim, MS Kim, JH Cho, DH Baek, SS Kim, BD Choi Journal of the Korean Physical Society 67, 991-994, 2015 | 7 | 2015 |
| Bias stress instability of LTPS TFTs on flexible substrate with activation annealing temperature S Kim, H Kim, K Kim, P Choi, B Choi Microelectronics Reliability 113, 113940, 2020 | 6 | 2020 |
| Effect of heat budget after capacitor formation on the leakage current characteristics of ZrO2-based high-k dielectrics for next-generation dynamic random-access memory capacitors JM Lee, PH Choi, JB Seo, BD Choi Journal of Nanoscience and Nanotechnology 20 (1), 367-372, 2020 | 6 | 2020 |
