| In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals JJ Geuchies, C Van Overbeek, WH Evers, B Goris, A De Backer, ... Nature materials 15 (12), 1248-1254, 2016 | 245 | 2016 |
| StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images A De Backer, KHW Van den Bos, W Van den Broek, J Sijbers, S Van Aert Ultramicroscopy 171, 104-116, 2016 | 217 | 2016 |
| Procedure to count atoms with trustworthy single-atom sensitivity S Van Aert, A De Backer, GT Martinez, B Goris, S Bals, G Van Tendeloo, ... Physical Review B—Condensed Matter and Materials Physics 87 (6), 064107, 2013 | 161 | 2013 |
| Measuring lattice strain in three dimensions through electron microscopy B Goris, J De Beenhouwer, A De Backer, D Zanaga, KJ Batenburg, ... Nano letters 15 (10), 6996-7001, 2015 | 146 | 2015 |
| Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals B Goris, A De Backer, S Van Aert, S Gómez-Graña, LM Liz-Marzán, ... Nano letters 13 (9), 4236-4241, 2013 | 123 | 2013 |
| Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations A De Backer, GT Martinez, A Rosenauer, S Van Aert Ultramicroscopy 134, 23-33, 2013 | 120 | 2013 |
| Three-dimensional quantification of the facet evolution of Pt nanoparticles in a variable gaseous environment T Altantzis, I Lobato, A De Backer, A Béché, Y Zhang, S Basak, M Porcu, ... Nano letters 19 (1), 477-481, 2018 | 119 | 2018 |
| Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy GT Martinez, A Rosenauer, A De Backer, J Verbeeck, S Van Aert Ultramicroscopy 137, 12-19, 2014 | 98 | 2014 |
| Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy KHW Van Den Bos, A De Backer, GT Martinez, N Winckelmans, S Bals, ... Physical Review Letters 116 (24), 246101, 2016 | 65 | 2016 |
| Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting A De Backer, GT Martinez, KE MacArthur, L Jones, A Béché, PD Nellist, ... Ultramicroscopy 151, 56-61, 2015 | 63 | 2015 |
| Estimation of unknown structure parameters from high-resolution (S) TEM images: what are the limits? AJ Den Dekker, J Gonnissen, A De Backer, J Sijbers, S Van Aert Ultramicroscopy 134, 34-43, 2013 | 53 | 2013 |
| Locating and controlling the Zn content in In (Zn) P quantum dots N Kirkwood, A De Backer, T Altantzis, N Winckelmans, A Longo, ... Chemistry of Materials 32 (1), 557-565, 2019 | 51 | 2019 |
| Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities A De Backer, L Jones, I Lobato, T Altantzis, B Goris, PD Nellist, S Bals, ... Nanoscale 9 (25), 8791-8798, 2017 | 50 | 2017 |
| Optimal experimental design for nano-particle atom-counting from high-resolution STEM images A De Backer, A De wael, J Gonnissen, S Van Aert Ultramicroscopy, 2014 | 49* | 2014 |
| Quantitative STEM normalisation: The importance of the electron flux GT Martinez, L Jones, A De Backer, A Béché, J Verbeeck, S Van Aert, ... Ultramicroscopy 159, 46-58, 2015 | 42 | 2015 |
| Advanced electron crystallography through model-based imaging S Van Aert, A De Backer, GT Martinez, AJ Den Dekker, D Van Dyck, ... IUCrJ 3 (1), 71-83, 2016 | 38 | 2016 |
| The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images GT Martinez, A De Backer, A Rosenauer, J Verbeeck, S Van Aert Micron 63, 57-63, 2014 | 36 | 2014 |
| Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images J Gonnissen, A De Backer, AJ Den Dekker, GT Martinez, A Rosenauer, ... Applied Physics Letters 105 (6), 2014 | 34 | 2014 |
| Hybrid statistics-simulations based method for atom-counting from ADF STEM images. A De Wael, A De Backer, L Jones, PD Nellist, S Van Aert Ultramicroscopy 177, 69-77, 2017 | 30 | 2017 |
| Atomic resolution electron tomography S Bals, B Goris, A De Backer, S Van Aert, G Van Tendeloo MRS Bulletin 41 (7), 525-530, 2016 | 30 | 2016 |
Sandra Van AertEMAT, University of Antwerp在 uantwerpen.be 的电子邮件经过验证
