| Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study AG Shard, R Havelund, SJ Spencer, IS Gilmore, MR Alexander, ... The Journal of Physical Chemistry B 119 (33), 10784-10797, 2015 | 74 | 2015 |
| Mixed polymer brushes for the selective capture and release of proteins A Bratek-Skicki, V Cristaudo, J Savocco, S Nootens, P Morsomme, ... Biomacromolecules 20 (2), 778-789, 2019 | 36 | 2019 |
| Sputtering of polymers by keV clusters: Microscopic views of the molecular dynamics A Delcorte, V Cristaudo, V Lebec, B Czerwinski International Journal of Mass Spectrometry 370, 29-38, 2014 | 35 | 2014 |
| A combined XPS/ToF-SIMS approach for the 3D compositional characterization of Zr-based conversion of galvanized steel V Cristaudo, K Baert, P Laha, ML Lim, E Brown-Tseng, H Terryn, ... Applied Surface Science 562, 150166, 2021 | 29 | 2021 |
| Ar cluster sputtering of polymers: effects of cluster size and molecular weights V Cristaudo, C Poleunis, B Czerwinski, A Delcorte Surface and Interface Analysis 46 (S1), 79-82, 2014 | 27 | 2014 |
| Temperature Dependence of Arn+ Cluster Backscattering from Polymer Surfaces: a New Method to Determine the Surface Glass Transition Temperature C Poleunis, V Cristaudo, A Delcorte Journal of The American Society for Mass Spectrometry 29 (1), 4-7, 2017 | 23 | 2017 |
| Ion yield enhancement at the organic/inorganic interface in SIMS analysis using Ar-GCIB V Cristaudo, C Poleunis, P Laha, P Eloy, T Hauffman, H Terryn, ... Applied Surface Science 536, 147716, 2021 | 20 | 2021 |
| Molecular Surface Analysis and Depth‐Profiling of Polyethylene Modified by an Atmospheric Ar‐D2O Post‐Discharge V Cristaudo, S Collette, N Tuccitto, C Poleunis, LC Melchiorre, ... Plasma Processes and Polymers 13 (11), 1106-1119, 2016 | 16 | 2016 |
| Chemical analysis of plasma‐treated organic surfaces and plasma polymers by secondary ion mass spectrometry A Delcorte, V Cristaudo, M Zarshenas, D Merche, F Reniers, P Bertrand Plasma Processes and Polymers 12 (9), 905-918, 2015 | 11 | 2015 |
| Surface Analysis and Ultra‐Shallow Molecular Depth‐Profiling of Polyethylene Treated by an Atmospheric Ar‐D2O Post‐Discharge V Cristaudo, S Collette, C Poleunis, F Reniers, A Delcorte Plasma Processes and Polymers 12 (9), 919-925, 2015 | 10 | 2015 |
| Effect of nanoconfinement on the sputter yield in ultrathin polymeric films: Experiments and model V Cristaudo, C Poleunis, A Delcorte Applied Surface Science 444, 780-788, 2018 | 9 | 2018 |
| Ex-situ SIMS characterization of plasma-deposited polystyrene near atmospheric pressure V Cristaudo, D Merche, C Poleunis, J Devaux, P Eloy, F Reniers, ... Applied Surface Science 481, 1490-1502, 2019 | 5 | 2019 |
| Unravelling the chemisorption mechanism of epoxy-amine coatings on Zr-based converted galvanized steel by combined static XPS/ToF-SIMS approach V Cristaudo, K Baert, P Laha, ML Lim, L Steely, E Brown-Tseng, H Terryn, ... Applied Surface Science 599, 153798, 2022 | 4 | 2022 |
| On the combination of ultraviolet photoelectron spectroscopy with optical absorption studies to investigate Cu2O|| TiO2 direct Z-scheme junctions with different Cu2O loading B de la Fuente, J Bomnuter, M Del Moro, L Smeesters, V Cristaudo, ... Applied Surface Science 657, 159796, 2024 | 2 | 2024 |
| MOLECULAR SURFACE ANALYSIS AND DEPTH-PROFILING OF POLYETHYLENE MODIFIED BY AN ATMOSPHERIC AR-D 2 O POST-DISCHARGE V Cristaudo, C POLEUNIS, LC MELCHIORRE, A DELCORTE, ... PLASMA PROCESSES AND POLYMERS 13 (11), 1104-1117, 2016 | 1 | 2016 |
| Re-print of “Sputtering of polymers by keV clusters: Microscopic views of the molecular dynamics” A Delcorte, V Cristaudo, V Lebec, B Czerwinski International Journal of Mass Spectrometry 377, 580-590, 2015 | 1 | 2015 |
| A. A ToF‐SIMS Study of the Polyethylene Chemical Modification Induced by an Atmospheric Ar‐D2O Post‐discharge V Cristaudo, S Collette, C Poleunis, F Reniers, A Delcorte International Plasma Chemistry Society, 2015 | 1 | 2015 |
| Fundamentals of soft matter desorption, molecular analysis and depth-profiling using massive keV clusters A Delcorte, E Pospisilova, C Poleunis, V Cristaudo Взаимодействие ионов с поверхностью ВИП-2015, 22-28, 2015 | 1 | 2015 |
| Direct electrodeposition on conductive polymer structures for microwave device manufacturing T Van Laar, S Gies, Y Rolain, T Collet, V Cristaudo, A Hubin, H Ottevaere, ... Additive Manufacturing 94, 104495, 2024 | | 2024 |
| Large substrate effect on the organic ion yields in SIMS analysis using Ar-GCIB V Cristaudo, C Poleunis, P Laha, P Eloy, T Hauffman, H Terryn, ... XXV Международная конференция Взаимодействие ионов с поверхностью «ВИП-2021 …, 2021 | | 2021 |
