| Electro-optic device (Thermal stability) RN Shaw, BDT Limited US Patent 5,189,713, 1993 | 19 | 1993 |
| An experimental investigation of ESD-induced damage to integrated circuits on printed circuit boards RN Shaw, RD Enoch Proceedings of the Electrical Overstress/Electrostatic Discharge (EOS/ESD …, 1985 | 16 | 1985 |
| An experimental validation of the field-induced ESD model RD Enoch, RN Shaw EOS/ESD Symposium Proceedings, EOS-8, 224-231, 1986 | 11 | 1986 |
| Electro-optic device (Electrical stability) RN Shaw, BTPL Company US Patent 5,218,468, 1993 | 10 | 1993 |
| High performance hermetic package for LiNbO3 electro-optic waveguide devices KR Preston, BM Macdonald, RA Harmon, CW Ford, RN Shaw, I Reid, ... OE/Fiber LASE'88, 25-32, 1989 | 9 | 1989 |
| A programmable equipment for ESD testing to the charged-device model RN Shaw Proceedings of EOS/ESD Symposium, 232-237, 1986 | 8 | 1986 |
| A programmable equipment for electrostatic discharge testing to human body models RN Shaw, RD Enoch Proc EOS/ESD Symp.(Third Edition), EOS-5, 48-55, 1983 | 7 | 1983 |
| Electro-optic device (Automatic offset bias) RN Shaw, BDT Limited US Patent 5,276,744, 1994 | 4 | 1994 |
| ESD sensitivity of NMOS LSI circuits and their failure characteristics RD Enoch, RN Shaw, RG Taylor EOS/ESD Symposium Proceedings, EOS-5, 185-197, 1983 | 4 | 1983 |
| Electrostatic discharge testing of integrated circuits using step-stress transients or multiple transients RN Shaw, RD Enoch Electronics Letters 22 (15), 813-815, 1986 | 3 | 1986 |
| LiNbO3 high speed travelling wave electro-optic waveguide devices AR Beaumont, KR Preston, BM Macdonald, RN Shaw, RA Harmon, ... Integrated Optical Circuit Engineering VI 993, 94-101, 1988 | 2 | 1988 |
| Degradation by ESD transients of the substrate bias voltage of NMOS 8085-type microprocessors RN Shaw, RD Enoch, RL Johnson, RG Taylor, J Woodhouse EOS/ESD Symp. Proc, 165-178, 1984 | 2 | 1984 |
| An introduction to system reliability analysis RN Shaw, IDE Videlo BT Technology Journal 11 (2), 1993 | 1 | 1993 |
| High-reliability semiconductor laser amplifiers SJ Fisher, CP Skrimshire, RN Shaw, JR Farr, PC Spurdens, HJ Wickes, ... ESSDERC 90. 20th European Solid State Device Research Conference, 417, 1990 | | 1990 |
| A rapid technique for assessing the moisture ingress susceptibility of plastic‐encapsulated integrated circuits EJ Chwastek, RN Shaw Quality and reliability engineering international 3 (3), 185-193, 1987 | | 1987 |
| Event-dependent ESD latent-failure behaviour of bipolar integrated circuits RD Enoch, RN Shaw Electrostatic Discharge Damage in Electronics - Seminar Proceedings (ERA …, 1986 | | 1986 |
| A dynamic bias system for burn-in or themal endurance treatments of 8085A microprocessors RN Shaw Microelectronics Reliability 22 (1), 117, 1982 | | 1982 |
Paul Spurdens在 physics.org 的电子邮件经过验证
Paul Spurdens在 physics.org 的电子邮件经过验证