| New approach to inter-technique comparisons for nanoparticle size measurements; using atomic force microscopy, nanoparticle tracking analysis and dynamic light scattering RD Boyd, SK Pichaimuthu, A Cuenat Colloids and Surfaces A: Physicochemical and Engineering Aspects 387 (1-3 …, 2011 | 202 | 2011 |
| Traceable size determination of nanoparticles, a comparison among European metrology institutes F Meli, T Klein, E Buhr, CG Frase, G Gleber, M Krumrey, A Duta, S Duta, ... Measurement Science and Technology 23 (12), 125005, 2012 | 133 | 2012 |
| Ge dot organization on Si substrates patterned by focused ion beam A Karmous, A Cuenat, A Ronda, I Berbezier, S Atha, R Hull Applied physics letters 85 (26), 6401-6403, 2004 | 125 | 2004 |
| Dynamic properties of AFM cantilevers and the calibration of their spring constants DA Mendels, M Lowe, A Cuenat, MG Cain, E Vallejo, D Ellis, F Mendels Journal of Micromechanics and Microengineering 16 (8), 1720, 2006 | 92 | 2006 |
| Lateral templating for guided self-organization of sputter morphologies A Cuenat, HB George, KC Chang, JM Blakely, MJ Aziz Advanced Materials 17 (23), 2845-2848, 2005 | 76 | 2005 |
| Optimization of 2DEG InAs/GaSb Hall sensors for single particle detection O Kazakova, JC Gallop, DC Cox, E Brown, A Cuenat, K Suzuki IEEE Transactions on Magnetics 44 (11), 4480-4483, 2008 | 64 | 2008 |
| New analysis procedure for fast and reliable size measurement of nanoparticles from atomic force microscopy images RD Boyd, A Cuenat Journal of Nanoparticle Research 13, 105-113, 2011 | 53 | 2011 |
| Spontaneous pattern formation from focused and unfocused ion beam irradiation A Cuenat, MJ Aziz MRS Online Proceedings Library (OPL) 696, N2. 8, 2001 | 31 | 2001 |
| Overview of MEMS sensors and the metrology requirements for their manufacture SP REILLY, RK LEACH, A CUENAT, SA AWAN, M LOWE | 19 | 2006 |
| Combined anomalous Nernst effect and thermography studies of ultrathin CoFeB/Pt nanowires J Wells, E Selezneva, P Krzysteczko, X Hu, HW Schumacher, R Mansell, ... AIP Advances 7 (5), 2017 | 18 | 2017 |
| Scanning thermal microscopy techniques for polymeric thin films using temperature contrast mode to measure thermal diffusivity and a novel approach in conductivity contrast … A Dawson, M Rides, AS Maxwell, A Cuenat, AR Samano Polymer Testing 41, 198-208, 2015 | 16 | 2015 |
| Formation of self-organized nanostructures on Ge during focused ion beam sputtering W Zhou, A Cuenat, MJ Aziz Microscopy of Semiconducting Materials 2003, 625-628, 2018 | 10 | 2018 |
| Quantitative nanoscale surface voltage measurement on organic semiconductor blends A Cuenat, A Muñiz-Piniella, M Muñoz-Rojo, WC Tsoi, CE Murphy Nanotechnology 23, 045703, 2012 | 9 | 2012 |
| Good practice guide for the determination of the size distributions of spherical nanoparticle samples. RD Boyd, A Cuenat, F Meli, T Klein, CG Frase, G Gleber, M Krumrey, ... | 9 | 2011 |
| Good practice guide for the determination of the size and size distribution of spherical nanoparticle samples RD Boyd, A Cuenat, F Meli, T Klein, CG Frase, G Gleber, M Krumrey, ... Good Practice Guide, 2011 | 8 | 2011 |
| Scanning Probe and particle beam microscopy A Cuenat Fundamental Principles of Engineering Nanometrology, 177-210, 2009 | 7 | 2009 |
| Precise measurement of the performance of thermoelectric modules P Díaz-Chao, A Muñiz-Piniella, E Selezneva, A Cuenat Measurement Science and Technology 27 (8), 085002, 2016 | 6 | 2016 |
| Determination of the elastic properties of multi-layered foils by the four-point micro-bending test DA MENDELS*, NMP Evanno, A Cuenat Philosophical Magazine 85 (16), 1765-1782, 2005 | 6 | 2005 |
| Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure Al A Cuenat, R Schäublin, A Hessler-Wyser, R Gotthardt Ultramicroscopy 83 (3-4), 179-191, 2000 | 6 | 2000 |
| Nanometrology foresight review H Bosse, R Boyd, U Brand, T Burke, A Cuenat, HU Danzebrink, K Dircherl, ... Co-nanomet project output, 2009 | 4 | 2009 |
