| The key is left under the mat: On the inappropriate security assumption of logic locking schemes MT Rahman, S Tajik, MS Rahman, M Tehranipoor, N Asadizanjani 2020 IEEE International Symposium on Hardware Oriented Security and Trust …, 2020 | 104 | 2020 |
| Hardware trust and assurance through reverse engineering: A tutorial and outlook from image analysis and machine learning perspectives UJ Botero, R Wilson, H Lu, MT Rahman, MA Mallaiyan, F Ganji, ... ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (4), 1-53, 2021 | 94 | 2021 |
| Defense-in-depth: A recipe for logic locking to prevail MT Rahman, MS Rahman, H Wang, S Tajik, W Khalil, F Farahmandi, ... Integration 72, 39-57, 2020 | 94 | 2020 |
| Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning NAMT Nidish Vashistha, Hangwei Lu, Qihang Shi, M Tanjidur Rahman, Haoting ... International symposium for Testing and Failure Analysis, 256, 2018 | 80* | 2018 |
| The big hack explained: Detection and prevention of PCB supply chain implants D Mehta, H Lu, OP Paradis, MA MS, MT Rahman, Y Iskander, P Chawla, ... ACM Journal on Emerging Technologies in Computing Systems (JETC) 16 (4), 1-25, 2020 | 77 | 2020 |
| Physical inspection & attacks: New frontier in hardware security MT Rahman, Q Shi, S Tajik, H Shen, DL Woodard, M Tehranipoor, ... 2018 IEEE 3rd International Verification and Security Workshop (IVSW), 93-102, 2018 | 72 | 2018 |
| Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing MT Nidish Vashistha, Tanjidur Rahman, Haoting Shen, Damon L. Woodard, Navid ... Journal of Hardware and Systems Security 2 (4), 2018 | 50 | 2018 |
| Is backside the new backdoor in modern socs? N Vashistha, MT Rahman, OP Dizon-Paradis, N Asadizanjani 2019 IEEE International Test Conference (ITC), 1-10, 2019 | 26 | 2019 |
| Secure interposer-based heterogeneous integration MSM Khan, C Xi, AA Khan, MT Rahman, MM Tehranipoor, ... IEEE Design & Test 39 (6), 156-164, 2022 | 20 | 2022 |
| Physical assurance N Asadizanjani, MT Rahman, M Tehranipoor Cham Switzerland: Springer Nature Switzerland AG, 2021 | 20 | 2021 |
| Backside security assessment of modern SoCs MT Rahman, N Asadizanjani 2019 20th International Workshop on Microprocessor/SoC Test, Security and …, 2019 | 18 | 2019 |
| Atpg-guided fault injection attacks on logic locking A Jain, MT Rahman, U Guin 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020 | 17 | 2020 |
| Special session: Novel attacks on logic-locking A Jain, U Guin, MT Rahman, N Asadizanjani, D Duvalsaint, RDS Blanton 2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020 | 17 | 2020 |
| Concealing-gate: Optical contactless probing resilient design MT Rahman, NF Dipu, D Mehta, S Tajik, M Tehranipoor, N Asadizanjani ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (3), 1-25, 2021 | 12 | 2021 |
| A time-dependent collisional sheath model for dual-frequency capacitively coupled RF plasma MT Rahman, MNA Dewan, A Ahmed, MRH Chowdhury IEEE Transactions on Plasma Science 41 (1), 17-23, 2012 | 11 | 2012 |
| On backside probing techniques and their emerging security threats LK Biswas, L Lavdas, MT Rahman, M Tehranipoor, N Asadizanjani IEEE Design & Test 39 (6), 172-179, 2022 | 10 | 2022 |
| Counterfeit detection and avoidance with physical inspection N Asadizanjani, MT Rahman, M Tehranipoor, N Asadizanjani, ... Physical Assurance: For Electronic Devices and Systems, 21-47, 2021 | 9 | 2021 |
| On optical attacks making logic obfuscation fragile L Lavdas, MT Rahman, M Tehranipoor, N Asadizanjani 2020 IEEE International Test Conference in Asia (ITC-Asia), 71-76, 2020 | 9 | 2020 |
| Analytical determination of collisional sheath properties for triple frequency capacitively coupled plasma MT Rahman, MNA Dewan IEEE Transactions on Plasma Science 42 (3), 729-734, 2014 | 8 | 2014 |
| AFIA: ATPG-guided fault injection attack on secure logic locking Y Zhong, A Jain, MT Rahman, N Asadizanjani, J Xie, U Guin Journal of Electronic Testing 38 (5), 527-546, 2022 | 7 | 2022 |
Mark M. TehranipoorIntel Charles E. Young Endowed Chair Professor, ECE, University of Florida在 ufl.edu 的电子邮件经过验证
