| Prognostics health management of electronic systems under mechanical shock and vibration using Kalman filter models and metrics P Lall, R Lowe, K Goebel IEEE Transactions on Industrial Electronics 59 (11), 4301-4314, 2012 | 77 | 2012 |
| Extended Kalman filter models and resistance spectroscopy for prognostication and health monitoring of leadfree electronics under vibration P Lall, R Lowe, K Goebel IEEE Transactions on Reliability 61 (4), 858-871, 2012 | 65 | 2012 |
| Prognostics using Kalman-Filter models and metrics for risk assessment in BGAs under shock and vibration loads P Lall, R Lowe, K Goebel 2010 proceedings 60th electronic components and technology conference (ECTC …, 2010 | 64 | 2010 |
| Resistance spectroscopy-based condition monitoring for prognostication of high reliability electronics under shock-impact P Lall, R Lowe, K Goebel 2009 59th Electronic Components and Technology Conference, 1245-1255, 2009 | 53 | 2009 |
| Method and apparatus for visualizing changes in data D Kumhyr, R Lowe US Patent App. 10/290,022, 2004 | 41 | 2004 |
| Survivability assessment of electronics subjected to mechanical shocks up to 25,000 g P Lall, K Dornala, R Lowe, J Foley 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2016 | 37 | 2016 |
| Use of prognostics in risk-based decision making for BGAs under shock and vibration loads P Lall, R Lowe, K Goebel 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2010 | 26 | 2010 |
| Drag and drop technique for building queries RP Lowe, GL Macomber, RW Ragan Jr US Patent 7,039,647, 2006 | 26 | 2006 |
| Modeling and reliability characterization of area-array electronics subjected to high-g mechanical shock up to 50,000 g P Lall, K Patel, R Lowe, M Strickland, J Blanche, D Geist, R Montgomery 2012 IEEE 62nd Electronic Components and Technology Conference, 1194-1204, 2012 | 24 | 2012 |
| Prognostication based on resistance-spectroscopy for high reliability electronics under shock-impact P Lall, R Lowe, J Suhling, K Goebel ASME International Mechanical Engineering Congress and Exposition 43789, 383-394, 2009 | 23 | 2009 |
| Prognostics and health monitoring of electronic systems P Lall, R Lowe, K Goebel 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and …, 2011 | 22 | 2011 |
| Method and apparatus for displaying resource information RC Bowser, BD Brandenburg, RP Lowe, DK Upton US Patent 6,943,793, 2005 | 18 | 2005 |
| Prognostication of accrued damage in board assemblies under thermal and mechanical stresses P Lall, R Lowe, K Goebel 2012 IEEE 62nd Electronic Components and Technology Conference, 1475-1487, 2012 | 16 | 2012 |
| Particle filter models and phase sensitive detection for prognostication and health monitoring of leadfree electronics under shock and vibration P Lall, R Lowe, K Goebel 2011 IEEE 61st Electronic Components and Technology Conference (ECTC), 1097-1109, 2011 | 16 | 2011 |
| Measurement and prediction of interface crack growth at the PCB-epoxy interfaces under high-G mechanical shock P Lall, K Dornala, J Deep, R Lowe 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2018 | 15 | 2018 |
| Comparison of Prognostic health management algorithms for assessment of electronic interconnect reliability under vibration P Lall, R Lowe Journal of Electronic Packaging 136 (4), 041013, 2014 | 14 | 2014 |
| Microsecond prognostics and health management R Lowe, J Dodson, J Foley IEEE Reliab. Soc. Newsl 60, 1-5, 2014 | 13 | 2014 |
| Effect of Drop Angle Variation and Restraint Mechanisms on Surface Mount Electronics under High G Shock P Lall, ARR Pandurangan, VKR Dornala, J Suhling, J Deep, R Lowe International Electronic Packaging Technical Conference and Exhibition 59322 …, 2019 | 12 | 2019 |
| Leading indicators for prognostic health management of electrical connectors subjected to random vibration P Lall, P Sakalaukus, R Lowe, K Goebel 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in …, 2012 | 10 | 2012 |
| Development of FE Models and Measurement of Internal Deformations of Fuze Electronics Using X-Ray MicroCT Data with Digital Volume Correlation P Lall, N Kothari, J Deep, J Foley, R Lowe 2017 IEEE 67th Electronic Components and Technology Conference (ECTC), 497-506, 2017 | 9 | 2017 |
