| Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films M Modreanu, J Sancho-Parramon, O Durand, B Servet, M Stchakovsky, ... Applied surface science 253 (1), 328-334, 2006 | 149 | 2006 |
| Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering A Ianculescu, M Gartner, B Despax, V Bley, T Lebey, R Gavrilă, ... Applied surface science 253 (1), 344-348, 2006 | 116 | 2006 |
| Enhancing the intrinsic p-type conductivity of the ultra-wide bandgap Ga 2 O 3 semiconductor E Chikoidze, C Sartel, H Mohamed, I Madaci, T Tchelidze, M Modreanu, ... Journal of Materials Chemistry C 7 (33), 10231-10239, 2019 | 98 | 2019 |
| A tunable microwave slot antenna based on graphene M Dragoman, D Neculoiu, AC Bunea, G Deligeorgis, M Aldrigo, ... Applied Physics Letters 106 (15), 2015 | 90 | 2015 |
| Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation K Cherkaoui, S Monaghan, MA Negara, M Modreanu, PK Hurley, ... Journal of Applied Physics 104 (6), 2008 | 85 | 2008 |
| On the structure, morphology and electrical conductivities of titanium oxide thin films D Mardare, C Baban, R Gavrila, M Modreanu, GI Rusu Surface Science 507, 468-472, 2002 | 85 | 2002 |
| Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells LL McManus, GA Burke, MM McCafferty, P O'Hare, M Modreanu, AR Boyd, ... Analyst 136 (12), 2471-2481, 2011 | 73 | 2011 |
| Electron scattering mechanisms in fluorine-doped SnO2 thin films G Rey, C Ternon, M Modreanu, X Mescot, V Consonni, D Bellet Journal of Applied Physics 114 (18), 2013 | 72 | 2013 |
| Effect of chlorine doping on electrical and optical properties of ZnO thin films E Chikoidze, M Nolan, M Modreanu, V Sallet, P Galtier Thin Solid Films 516 (22), 8146-8149, 2008 | 72 | 2008 |
| Interface of ultrathin HfO2 films deposited by UV-photo-CVD Q Fang, JY Zhang, Z Wang, M Modreanu, BJ O'sullivan, PK Hurley, ... Thin Solid Films 453, 203-207, 2004 | 72 | 2004 |
| Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells R Ginige, B Corbett, M Modreanu, C Barrett, J Hilgarth, G Isella, ... Semiconductor science and technology 21 (6), 775, 2006 | 70 | 2006 |
| Long-term stability of mechanically exfoliated MoS2 flakes P Budania, P Baine, J Montgomery, C McGeough, T Cafolla, M Modreanu, ... MRS Communications 7 (4), 813-818, 2017 | 63 | 2017 |
| Solid phase crystallisation of HfO2 thin films M Modreanu, J Sancho-Parramon, D O’Connell, J Justice, O Durand, ... Materials Science and Engineering: B 118 (1-3), 127-131, 2005 | 59 | 2005 |
| X-ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-κ materials S Ferrari, M Modreanu, G Scarel, M Fanciulli Thin Solid Films 450 (1), 124-127, 2004 | 56 | 2004 |
| Properties of rf-sputtered indium–tin-oxynitride thin films E Aperathitis, M Bender, V Cimalla, G Ecke, M Modreanu Journal of applied physics 94 (2), 1258-1266, 2003 | 55 | 2003 |
| Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion J Sancho-Parramon, M Modreanu, S Bosch, M Stchakovsky Thin Solid Films 516 (22), 7990-7995, 2008 | 53 | 2008 |
| Optical properties of LPCVD silicon oxynitride M Modreanu, N Tomozeiu, P Cosmin, M Gartner Thin Solid Films 337 (1-2), 82-84, 1999 | 53 | 1999 |
| Optimisation and scaling of interfacial GeO2 layers for high-κ gate stacks on germanium and extraction of dielectric constant of GeO2 SNA Murad, PT Baine, DW McNeill, SJN Mitchell, BM Armstrong, ... Solid-state electronics 78, 136-140, 2012 | 51 | 2012 |
| Very large phase shift of microwave signals in a 6 nm HfxZr1− xO2 ferroelectric at±3 V M Dragoman, M Modreanu, IM Povey, S Iordanescu, M Aldrigo, ... Nanotechnology 28 (38), 38LT04, 2017 | 46 | 2017 |
| Extraordinary tunability of high-frequency devices using Hf0. 3Zr0. 7O2 ferroelectric at very low applied voltages M Dragoman, M Aldrigo, M Modreanu, D Dragoman Applied Physics Letters 110 (10), 2017 | 44 | 2017 |
Olivier DURANDINSA de Rennes在 insa-rennes.fr 的电子邮件经过验证
