| Extreme environment electronics JD Cressler, HA Mantooth CRC Press, 2013 | 299* | 2013 |
| Capturing dynamic patterns of task-based functional connectivity with EEG N Karamzadeh, A Medvedev, A Azari, A Gandjbakhche, L Najafizadeh NeuroImage 66, 311-317, 2013 | 89 | 2013 |
| Application of RHBD techniques to SEU hardening of third-generation SiGe HBT logic circuits R Krithivasan, PW Marshall, M Nayeem, AK Sutton, WM Kuo, ... IEEE Transactions on Nuclear Science 53 (6), 3400-3407, 2006 | 61 | 2006 |
| Sub-1-K operation of SiGe transistors and circuits L Najafizadeh, JS Adams, SD Phillips, KA Moen, JD Cressler, S Aslam, ... IEEE Electron Device Letters 30 (5), 508-510, 2009 | 60 | 2009 |
| Cuff-less blood pressure estimation from photoplethysmography via visibility graph and transfer learning W Wang, P Mohseni, KL Kilgore, L Najafizadeh IEEE Journal of Biomedical and Health Informatics 26 (5), 2075-2085, 2022 | 54 | 2022 |
| CMOS reliability issues for emerging cryogenic Lunar electronics applications T Chen, C Zhu, L Najafizadeh, B Jun, A Ahmed, R Diestelhorst, G Espinel, ... Solid-state electronics 50 (6), 959-963, 2006 | 51 | 2006 |
| Towards a sub-1 V CMOS voltage reference L Najafizadeh, IM Filanovsky 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No …, 2004 | 46 | 2004 |
| A high-slew rate SiGe BiCMOS operational amplifier for operation down to deep cryogenic temperatures R Krithivasan, Y Lu, L Najafizadeh, C Zhu, JD Cressler, S Chen, ... 2006 Bipolar/BiCMOS Circuits and Technology Meeting, 1-4, 2006 | 45 | 2006 |
| Single event transient response of SiGe voltage references and its impact on the performance of analog and mixed-signal circuits L Najafizadeh, SD Phillips, KA Moen, RM Diestelhorst, M Bellini, PK Saha, ... IEEE Transactions on Nuclear Science 56 (6), 3469-3476, 2009 | 43 | 2009 |
| Predicting intention through eye gaze patterns F Koochaki, L Najafizadeh 2018 IEEE Biomedical Circuits and Systems Conference (BioCAS), 1-4, 2018 | 38 | 2018 |
| BER analysis of arbitrary QAM for MRC diversity with imperfect channel estimation in generalized Ricean fading channels L Najafizadeh, C Tellambura IEEE Transactions on Vehicular Technology 55 (4), 1239-1248, 2006 | 38 | 2006 |
| Normative database of judgment of complexity task with functional near infrared spectroscopy—application for TBI F Amyot, T Zimmermann, J Riley, JM Kainerstorfer, V Chernomordik, ... Neuroimage 60 (2), 879-883, 2012 | 37 | 2012 |
| BiCMOS-Based Compensation: Toward Fully Curvature-Corrected Bandgap Reference Circuits Y Huang, L Zhu, F Kong, C Cheung, L Najafizadeh IEEE Transactions on Circuits and Systems I: Regular Papers, 2018 | 33 | 2018 |
| Proton tolerance of SiGe precision voltage references for extreme temperature range electronics L Najafizadeh, M Bellini, APG Prakash, GA Espinel, JD Cressler, ... IEEE Transactions on Nuclear Science 53 (6), 3210-3216, 2006 | 33 | 2006 |
| A simple voltage reference using transistor with ZTC point and PTAT current source L Najafizadeh, IM Filanovsky 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No …, 2004 | 33 | 2004 |
| Decoding cortical brain states from widefield calcium imaging data using visibility graph L Zhu, CR Lee, DJ Margolis, L Najafizadeh Biomedical optics express 9 (7), 3017-3036, 2018 | 32 | 2018 |
| SiGe BiCMOS precision voltage references for extreme temperature range electronics L Najafizadeh, C Zhu, R Krithivasan, JD Cressler, Y Cui, G Niu, S Chen, ... 2006 Bipolar/BiCMOS Circuits and Technology Meeting, 1-4, 2006 | 31 | 2006 |
| Single-event transient and total dose response of precision voltage reference circuits designed in a 90-nm SiGe BiCMOS technology AS Cardoso, PS Chakraborty, N Karaulac, DM Fleischhauer, ... IEEE transactions on Nuclear Science 61 (6), 3210-3217, 2014 | 26 | 2014 |
| Early classification of motor tasks using dynamic functional connectivity graphs from EEG F Shamsi, A Haddad, L Najafizadeh Journal of neural engineering 18 (1), 016015, 2021 | 25 | 2021 |
| Accurate modeling of single-event transients in a SiGe voltage reference circuit KA Moen, L Najafizadeh, J Seungwoo, A Raman, M Turowski, ... IEEE Transactions on Nuclear Science 58 (3), 877-884, 2011 | 25 | 2011 |
John D. CresslerRegents Professor, School of Electrical and Computer Engineering Georgia Tech在 ece.gatech.edu 的电子邮件经过验证
