| Influence of Si-Doping on 45 nm Thick Ferroelectric ZrO2 Films B Xu, PD Lomenzo, A Kersch, T Mikolajick, U Schroeder ACS Applied Electronic Materials 4 (7), 3648-3654, 2022 | 20 | 2022 |
| Reduced fatigue and leakage of ferroelectric TiN/Hf0. 5Zr0. 5O2/TiN capacitors by thin alumina interlayers at the top or bottom interface HA Hsain, Y Lee, S Lancaster, PD Lomenzo, B Xu, T Mikolajick, ... Nanotechnology 34 (12), 125703, 2023 | 17 | 2023 |
| Investigating charge trapping in ferroelectric thin films through transient measurements S Lancaster, PD Lomenzo, M Engl, B Xu, T Mikolajick, U Schroeder, ... Frontiers in Nanotechnology 4, 939822, 2022 | 16 | 2022 |
| Reliability Improvement from La2O3 Interfaces in Hf0.5Zr0.5O2‐Based Ferroelectric Capacitors F Mehmood, R Alcala, P Vishnumurthy, B Xu, R Sachdeva, T Mikolajick, ... Advanced Materials Interfaces 10 (8), 2202151, 2023 | 14 | 2023 |
| Role of Oxygen Source on Buried Interfaces in Atomic-Layer-Deposited Ferroelectric Hafnia–Zirconia Thin Films HA Hsain, Y Lee, S Lancaster, M Materano, R Alcala, B Xu, T Mikolajick, ... ACS Applied Materials & Interfaces 14 (37), 42232-42244, 2022 | 14 | 2022 |
| Discovery of Nanoscale Electric Field‐Induced Phase Transitions in ZrO2 PD Lomenzo, L Collins, R Ganser, B Xu, R Guido, A Gruverman, A Kersch, ... Advanced Functional Materials 33 (41), 2303636, 2023 | 13 | 2023 |
| Using Raman spectroscopy and x-ray diffraction for phase determination in ferroelectric mixed Hf1− xZrxO2-based layers U Schroeder, R Sachdeva, PD Lomenzo, B Xu, M Materano, T Mikolajick, ... Journal of Applied Physics 132 (21), 2022 | 13 | 2022 |
| Influence of the Ozone Dose Time during Atomic Layer Deposition on the Ferroelectric and Pyroelectric Properties of 45 nm-Thick ZrO2 Films B Xu, L Collins, KM Holsgrove, T Mikolajick, U Schroeder, PD Lomenzo ACS Applied Electronic Materials 5 (4), 2288-2295, 2023 | 12 | 2023 |
| Strain as a Global Factor in Stabilizing the Ferroelectric Properties of ZrO2 B Xu, PD Lomenzo, A Kersch, T Schenk, C Richter, CM Fancher, ... Advanced Functional Materials 34 (8), 2311825, 2024 | 4 | 2024 |
| The Role of Interface Dynamics on the Reliability Performance of BEOL Integrated Ferroelectric HfO2 Capacitors R Alcala, PD Lomenzo, T Mittmann, B Xu, R Guido, S Lancaster, ... 2022 International Electron Devices Meeting (IEDM), 32.8. 1-32.8. 4, 2022 | 4 | 2022 |
| Wake-up free ferroelectric hafnia-zirconia capacitors fabricated via vacuum-maintaining atomic layer deposition HA Hsain, Y Lee, PD Lomenzo, R Alcala, B Xu, T Mikolajick, U Schroeder, ... Journal of Applied Physics 133 (22), 2023 | 2 | 2023 |
| Influence of Biaxial Strain and Interfacial Layer Growth on Ferroelectric Wake-Up and Phase Transition Fields in ZrO2 B Xu, R Ganser, KM Holsgrove, X Wang, P Vishnumurthy, T Mikolajick, ... ACS Applied Materials & Interfaces, 2024 | 1 | 2024 |
| Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors P Vishnumurthy, B Xu, F Wunderwald, C Richter, O Rehm, L Baumgarten, ... ACS Applied Electronic Materials, 2024 | | 2024 |
| Ferroelectric Al0.85Sc0.15N and Hf0.5Zr0.5O2 Domain Switching Dynamics R Guido, X Wang, B Xu, R Alcala, T Mikolajick, U Schroeder, PD Lomenzo ACS Applied Materials & Interfaces, 2024 | | 2024 |
| Voltage Programmable Pyroelectric Sensors with ZrO2-based Antiferroelectrics PD Lomenzo, S Li, B Xu, T Mikolajick, U Schroeder IEEE Sensors Journal, 2024 | | 2024 |
| Mechanism of Antiferroelectricity in Polycrystalline ZrO2 R Ganser, PD Lomenzo, L Collins, B Xu, LA Antunes, T Mikolajick, ... Advanced Functional Materials, 2405513, 2024 | | 2024 |
