| General and self-consistent method for the calibration of polarization modulators, polarimeters, and Mueller-matrix ellipsometers E Compain, S Poirier, B Drevillon Applied optics 38 (16), 3490-3502, 1999 | 405 | 1999 |
| Optimized Mueller polarimeter with liquid crystals A De Martino, YK Kim, E Garcia-Caurel, B Laude, B Drévillon Optics letters 28 (8), 616-618, 2003 | 322 | 2003 |
| Fast polarization modulated ellipsometer using a microprocessor system for digital Fourier analysis B Drevillon, J Perrin, R Marbot, A Violet, JL Dalby Review of Scientific Instruments 53 (7), 969-977, 1982 | 265 | 1982 |
| Mueller polarimetric imaging system with liquid crystals B Laude-Boulesteix, A De Martino, B Drévillon, L Schwartz Applied optics 43 (14), 2824-2832, 2004 | 240 | 2004 |
| Phase modulated ellipsometry from the ultraviolet to the infrared: in situ application to the growth of semiconductors B Drévillon Progress in crystal growth and characterization of materials 27 (1), 1-87, 1993 | 208 | 1993 |
| Improvements of phase‐modulated ellipsometry O Acher, E Bigan, B Drévillon Review of scientific instruments 60 (1), 65-77, 1989 | 200 | 1989 |
| Dissociation cross sections of silane and disilane by electron impact J Perrin, JPM Schmitt, G De Rosny, B Drevillon, J Huc, A Lloret Chemical Physics 73 (3), 383-394, 1982 | 192 | 1982 |
| Substrate selectivity in the formation of microcrystalline silicon: Mechanisms and technological consequences P Roca i Cabarrocas, N Layadi, T Heitz, B Drévillon, I Solomon Applied Physics Letters 66 (26), 3609-3611, 1995 | 179 | 1995 |
| Phase-modulated Mueller ellipsometry characterization of scattering by latex sphere suspensions B Kaplan, E Compain, B Drevillon Applied Optics 39 (4), 629-636, 2000 | 166 | 2000 |
| Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma … N Layadi, PR i Cabarrocas, B Drévillon, I Solomon Physical Review B 52 (7), 5136, 1995 | 161 | 1995 |
| Quantitative study of C—H bonding in polymerlike amorphous carbon films using in situ infrared ellipsometry T Heitz, B Drevillon, C Godet, JE Bouree Physical review B 58 (20), 13957, 1998 | 160 | 1998 |
| Spectroscopic Mueller polarimeter based on liquid crystal devices E Garcia-Caurel, A De Martino, B Drevillon Thin Solid Films 455, 120-123, 2004 | 156 | 2004 |
| Photoproduction of ϱ0 and ω on hydrogen at photon energies of 20 to 70 GeV D Aston, M Atkinson, R Bailey, AH Ball, HJ Bautsch, B Bouquet, ... Nuclear Physics B 209 (1), 56-76, 1982 | 140 | 1982 |
| Silane dissociation mechanisms and thin film formation in a low pressure multipole dc discharge B Drevillon, J Huc, A Lloret, J Perrin, G De Rosny, JPM Schmitt Applied physics letters 37 (7), 646-648, 1980 | 120 | 1980 |
| Full-field optical coherence tomography with thermal light B Laude, A De Martino, B Drevillon, L Benattar, L Schwartz Applied optics 41 (31), 6637-6645, 2002 | 118 | 2002 |
| Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronics T Novikova, A De Martino, SB Hatit, B Drévillon Applied optics 45 (16), 3688-3697, 2006 | 115 | 2006 |
| Broadband division-of-amplitude polarimeter based on uncoated prisms E Compain, B Drevillon Applied optics 37 (25), 5938-5944, 1998 | 108 | 1998 |
| General methods for optimized design and calibration of Mueller polarimeters A De Martino, E Garcia-Caurel, B Laude, B Drévillon Thin Solid Films 455, 112-119, 2004 | 107 | 2004 |
| A real time ellipsometry study of the growth of amorphous silicon on transparent conducting oxides S Kumar, B Drevillon Journal of Applied Physics 65 (8), 3023-3034, 1989 | 107 | 1989 |
| I n situ spectroscopic ellipsometry study of the growth of microcrystalline silicon S Kumar, B Drevillon, C Godet Journal of applied physics 60 (4), 1542-1544, 1986 | 107 | 1986 |
