| Timing performance of nanometer digital circuits under process variations V Champac, JG Gervacio Springer International Publishing, 2018 | 29 | 2018 |
| PSEM Approximations for Both Branches of Lambert W Function with Applications H Vazquez-Leal, MA Sandoval-Hernandez, JL Garcia-Gervacio, ... Discrete Dynamics in Nature and Society 2019 (1), 8267951, 2019 | 22 | 2019 |
| SCADA system design: A proposal for optimizing a production line JAR Carmona, JCM Benítez, JL García-Gervacio 2016 International Conference on Electronics, Communications and Computers …, 2016 | 18 | 2016 |
| Testing of resistive opens in CMOS latches and flip-flops VH Champac, A Zenteno, JL Garcia European Test Symposium (ETS'05), 34-40, 2005 | 18 | 2005 |
| Direct application of Padé approximant for solving nonlinear differential equations H Vazquez-Leal, B Benhammouda, U Filobello-Nino, A Sarmiento-Reyes, ... SpringerPlus 3, 1-11, 2014 | 17 | 2014 |
| A design methodology for logic paths tolerant to local intra-die variations D Iparraguirre-Cárdenas, JL Garcia-Gervacio, V Champac Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on, 596-599, 2008 | 12 | 2008 |
| Small-delay defects detection under process variation using Inter-Path Correlation FJ Galarza-Medina, JL García-Gervacio, V Champac, A Orailoglu 2012 IEEE 30th VLSI Test Symposium (VTS), 127-132, 2012 | 10 | 2012 |
| TCAD analysis and modeling for NBTI mechanism in FinFET transistors A Herrera-Moreno, JL García-Gervacio, H Villacorta-Minaya, ... IEICE Electronics Express 15 (14), 20180502-20180502, 2018 | 9 | 2018 |
| Direct application of Pade approximant for solving nonlinear differential equations. SpringerPlus, 3 (563) H Vazquez-Leal, B Benhammouda, U Filobello-Nino, A Darmiento-Reyes, ... | 7 | 2014 |
| Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs JL García-Gervacio, V Champac Test Symposium (ETS), 2010 15th IEEE European, 126-131, 2010 | 7 | 2010 |
| Computing the Detection Probability for Small Delay Defects of Nanometer ICs JL García-Gervacio, V Champac Journal of Electronic Testing, 1-12, 2011 | 4 | 2011 |
| A methodology to compute the statistical fault coverage of small delays due to opens JL Garcia-Gervacio, V Champac 2009 52nd IEEE International Midwest Symposium on Circuits and Systems, 1211 …, 2009 | 4 | 2009 |
| Detectability analysis of small delays due to resistive opens considering process variations JL Garcia-Gervacio, V Champac On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International, 195-197, 2009 | 4 | 2009 |
| Low VDD and body bias conditions for testing bridge defects in the presence of process variations H Villacorta, J Garcia-Gervacio, J Segura, V Champac Microelectronics Journal 46 (5), 398-403, 2015 | 3 | 2015 |
| Screening small-delay defects using inter-path correlation to reduce reliability risk JL García-Gervacio, A Nocua, V Champac Microelectronics Reliability 55 (6), 1005-1011, 2015 | 3 | 2015 |
| Process Variations V Champac, J Garcia Gervacio, V Champac, J Garcia Gervacio Timing Performance of Nanometer Digital Circuits Under Process Variations, 41-69, 2018 | 2 | 2018 |
| Testbed module for UHF passive RFID tags LF Lagunes-Aranda, AG Martínez-López, J Martínez-Castillo, ... 2016 IEEE International Engineering Summit, II Cumbre Internacional de las …, 2016 | 2 | 2016 |
| Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies JL García-Gervacio, J Martínez-Castillo, V Champac 2014 15th Latin American Test Workshop-LATW, 1-6, 2014 | 2 | 2014 |
| Voltage Regulation System for UHF RFID Tags JLG Gervacio, ALH May, GZ Mejía, JM Castillo, AD Sánchez 2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI), 1-6, 2013 | 2 | 2013 |
| Designing with FinFETs and Process Variation Impact V Champac, J Garcia Gervacio, V Champac, J Garcia Gervacio Timing Performance of Nanometer Digital Circuits Under Process Variations …, 2018 | 1 | 2018 |
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