| Lead-free perovskite nanowire array photodetectors with drastically improved stability in nanoengineering templates A Waleed, MM Tavakoli, L Gu, Z Wang, D Zhang, A Manikandan, Q Zhang, ... Nano Lett 17, 523-530, 2017 | 266 | 2017 |
| All Inorganic Cesium Lead Iodide Perovskite Nanowires with Stabilized Cubic Phase at Room Temperature and Nanowire Array-based Photodetectors A Waleed, MM Tavakoli, L Gu, S Hussain, D Zhang, S Poddar, Z Wang, ... Nano Letters 17 (8), 4951-4957, 2017 | 231 | 2017 |
| Broadband optical absorption by tunable Mie resonances in silicon nanocone arrays ZY Wang, RJ Zhang, SY Wang, M Lu, X Chen, YX Zheng, LY Chen, Z Ye, ... Scientific reports 5, 7810, 2015 | 157 | 2015 |
| The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition ZY Wang, RJ Zhang, HL Lu, X Chen, Y Sun, Y Zhang, YF Wei, JP Xu, ... Nanoscale research letters 10 (1), 1-6, 2015 | 103 | 2015 |
| Optical properties of thickness-controlled MoS2 thin films studied by spectroscopic ellipsometry D Li, X Song, J Xu, Z Wang, R Zhang, P Zhou, H Zhang, R Huang, ... Applied Surface Science 421, 884-890, 2017 | 60 | 2017 |
| Optical properties of epitaxial BiFeO 3 thin film grown on SrRuO 3-buffered SrTiO 3 substrate JP Xu, RJ Zhang, ZH Chen, ZY Wang, F Zhang, X Yu, AQ Jiang, ... Nanoscale research letters 9 (1), 1-6, 2014 | 45 | 2014 |
| Temperature-dependent optical properties of titanium oxide thin films studied by spectroscopic ellipsometry F Zhang, RJ Zhang, DX Zhang, ZY Wang, JP Xu, YX Zheng, LY Chen, ... Applied Physics Express 6 (12), 121101, 2013 | 41 | 2013 |
| The thickness-dependent band gap and defect features of ultrathin ZrO 2 films studied by spectroscopic ellipsometry JP Xu, RJ Zhang, Y Zhang, ZY Wang, L Chen, QH Huang, HL Lu, ... Physical Chemistry Chemical Physics 18 (4), 3316-3321, 2016 | 38 | 2016 |
| Influence of hydration water on CH 3 NH 3 PbI 3 perovskite films prepared through one-step procedure Z Wang, S Yuan, D Li, F Jin, R Zhang, Y Zhan, M Lu, S Wang, Y Zheng, ... Optics Express 24 (22), A1431-A1443, 2016 | 27 | 2016 |
| Thickness dependent optical properties of titanium oxide thin films. ZJ Xu, F Zhang, RJ Zhang, X Yu, DX Zhang, ZY Wang, YX Zheng, ... Applied Physics A: Materials Science & Processing 113 (3), 2013 | 25 | 2013 |
| Quadrupole mode plasmon resonance enabled subwavelength metal-dielectric grating optical reflection filters Z Wang, R Zhang, J Guo Optics Express 26 (1), 496-504, 2018 | 21 | 2018 |
| Dielectric functions and critical points of crystalline WS 2 ultrathin films with tunable thickness DH Li, H Zheng, ZY Wang, RJ Zhang, H Zhang, YX Zheng, SY Wang, ... Physical Chemistry Chemical Physics 19 (19), 12022-12031, 2017 | 20 | 2017 |
| Thickness-dependent free-electron relaxation time of Au thin films in near-infrared region MY Zhang, ZY Wang, TN Zhang, Y Zhang, RJ Zhang, X Chen, Y Sun, ... Journal of Nanophotonics 10 (3), 033009, 2016 | 10 | 2016 |
| Substantial influence on solar energy harnessing ability by geometries of ordered Si nanowire array Z Wu, Z Wang, S Wang, Z Zhong Nanoscale research letters 9 (1), 1-6, 2014 | 10 | 2014 |
| 基于全反射的发光二极管-照明光纤耦合器的设计与研制 王子仪， 张荣君， 徐蔚， 徐子杰， 张帆， 俞翔， 王松有， 郑玉祥， 陈良尧 光学学报 32 (9), 258-262, 2012 | 10 | 2012 |
| Study on electrical defects level in single layer two-dimensional Ta2O5 D Li, X Song, L Hu, Z Wang, R Zhang, L Chen, DW Zhang, P Zhou Chinese Physics B 25 (4), 047304, 2016 | 9 | 2016 |
| Study of the thickness effect on the dielectric functions by utilizing a wedge-shaped Ti film sample with continuously varied thickness. ET Hu, RJ Zhang, QY Cai, ZY Wang, JP Xu, YX Zheng, SY Wang, YF Wei, ... Applied Physics A: Materials Science & Processing 120 (3), 2015 | 9 | 2015 |
| Ultrafast modulation of exchange-coupling induced anisotropy in Fe/CoO by laser induced charge transfer Z Zheng, Q Li, JY Shi, T Gu, ZY Wang, LQ Shen, F Jin, HC Yuan, ... Applied Physics Letters 110 (17), 172401, 2017 | 7 | 2017 |
| AFM 扫描参数对样品粗糙度测量的影响 王子仪， 张荣君， 郑玉祥， 张振生， 李海涛 实验室研究与探索 32 (2), 5-7, 2013 | 5 | 2013 |
| Contribution of thickness dependent void fraction and TiSi x O y interlayer to the optical properties of amorphous TiO2 thin films F Zhang, RJ Zhang, YX Zheng, ZJ Xu, DX Zhang, ZY Wang, X Yu, ... Thin Solid Films 548, 275-279, 2013 | 2 | 2013 |
Songyou WangDepartment of Optical Science and Engineering,Fudan university在 fudan.edu.cn 的电子邮件经过验证
