On generalizing process capability indices SS Maiti, M Saha, AK Nanda Quality Technology & Quantitative Management 7 (3), 279-300, 2010 | 70 | 2010 |
Bootstrap confidence intervals of generalized process capability index Cpyk for Lindley and power Lindley distributions S Dey, M Saha, SS Maiti, CH Jun Communications in Statistics-Simulation and Computation 47 (1), 249-262, 2018 | 44 | 2018 |
The inverse xgamma distribution: statistical properties and different methods of estimation AS Yadav, SS Maiti, M Saha Annals of Data Science 8, 275-293, 2021 | 35 | 2021 |
Classical and Bayesian inference of Cpy for generalized Lindley distributed quality characteristic M Saha, S Dey, AS Yadav, S Kumar Quality and Reliability Engineering International 35 (8), 2593-2611, 2019 | 35 | 2019 |
Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution H Tripathi, S Dey, M Saha Journal of Applied Statistics 48 (7), 1227-1242, 2021 | 33 | 2021 |
Parametric and non-parametric bootstrap confidence intervals of CNpk for exponential power distribution M Saha, S Dey, SS Maiti Journal of Industrial and Production Engineering 35 (3), 160-169, 2018 | 31 | 2018 |
Bootstrap confidence intervals of generalized process capability index Cpyk using different methods of estimation S Dey, M Saha Journal of Applied Statistics 46 (10), 1843-1869, 2019 | 29 | 2019 |
Single and double acceptance sampling plans for truncated life tests based on transmuted Rayleigh distribution M Saha, H Tripathi, S Dey Journal of Industrial and Production Engineering 38 (5), 356-368, 2021 | 25 | 2021 |
Confidence intervals of the index for normally distributed quality characteristics using classical and Bayesian methods of estimation M Saha, S Dey, AS Yadav, S Ali | 24 | 2021 |
Bayesian estimation of generalized process capability indices SS Maiti, M Saha Journal of Probability and Statistics 2012 (1), 819730, 2012 | 24 | 2012 |
Bootstrap confidence intervals of CpTk for two parameter logistic exponential distribution with applications M Saha, S Dey, SS Maiti International Journal of System Assurance Engineering and Management 10 (4 …, 2019 | 23 | 2019 |
Validation of Xgamma exponential model via Nikulin-Rao-Robson goodness-of-fit-test under complete and censored sample with different methods of estimation AS Yadav, S Shukla, H Goual, M Saha, HM Yousof Statistics, Optimization & Information Computing 10 (2), 457-483, 2022 | 21 | 2022 |
Bootstrap confidence intervals of process capability index Spmk using different methods of estimation S Dey, M Saha Journal of Statistical Computation and Simulation 90 (1), 28-50, 2020 | 20 | 2020 |
Asymptotic and Bootstrap Confidence Intervals for the Process Capability Index cpy Based on Lindley Distributed Quality Characteristic M Saha, S Kumar, SS Maiti, A Singh Yadav, S Dey American Journal Of Mathematical And Management Sciences 39 (1), 75-89, 2020 | 18 | 2020 |
An application of time truncated single acceptance sampling inspection plan based on generalized half-normal distribution H Tripathi, M Saha, V Alha Annals of Data Science, 1-13, 2020 | 18 | 2020 |
Improved Attribute Chain Sampling Plan for Darna Distribution. H Tripathi, AI Al-Omari, M Saha, ARA Alanzi Comput. Syst. Sci. Eng. 38 (3), 381-392, 2021 | 16 | 2021 |
Bootstrap confidence intervals of the difference between two generalized process capability indices for inverse Lindley distribution S Dey, M Saha Life Cycle Reliability and Safety Engineering 7, 89-96, 2018 | 15 | 2018 |
Asymptotic and bootstrap confidence intervals of generalized process capability index for exponentially distributed quality characteristic M Saha, S Kumar, SS Maiti, AS Yadav Life Cycle Reliability And Safety Engineering 7, 235-243, 2018 | 13 | 2018 |
Parametric inference of the process capability index <?xpag &Ccal;pc?> for exponentiated exponential distribution M Saha, S Dey, S Nadarajah Journal of Applied Statistics 49 (16), 4097-4121, 2022 | 12 | 2022 |
Parametric inference of generalized process capability index Cpyk for the power Lindley distribution S Kumar, AS Yadav, S Dey, M Saha Quality Technology & Quantitative Management 19 (2), 153-186, 2022 | 12 | 2022 |