Covalency of the hydrogen bond in ice: a direct X-ray measurement ED Isaacs, A Shukla, PM Platzman, DR Hamann, B Barbiellini, CA Tulk Physical Review Letters 82 (3), 600, 1999 | 520 | 1999 |
Analysis of positron lifetime spectra using quantified maximum entropy and a general linear filter A Shukla, M Peter, L Hoffmann Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1993 | 369 | 1993 |
Probing the 3d spin momentum with X-ray emission spectroscopy: The case of molecular-spin transitions G Vankó, T Neisius, G Molnar, F Renz, S Karpati, A Shukla, FMF De Groot The Journal of Physical Chemistry B 110 (24), 11647-11653, 2006 | 322 | 2006 |
Inelastic x-ray scattering by electronic excitations under high pressure JP Rueff, A Shukla Reviews of Modern Physics 82 (1), 847-896, 2010 | 215 | 2010 |
Temperature- and pressure-induced spin-state transitions in G Vankó, JP Rueff, A Mattila, Z Németh, A Shukla Physical Review B—Condensed Matter and Materials Physics 73 (2), 024424, 2006 | 211 | 2006 |
Phonon Dispersion and Lifetimes in A Shukla, M Calandra, M d’Astuto, M Lazzeri, F Mauri, C Bellin, M Krisch, ... Physical review letters 90 (9), 095506, 2003 | 184 | 2003 |
A high performance graphene/few-layer InSe photo-detector Z Chen, J Biscaras, A Shukla Nanoscale 7 (14), 5981-5986, 2015 | 174 | 2015 |
The GALAXIES beamline at the SOLEIL synchrotron: inelastic X-ray scattering and photoelectron spectroscopy in the hard X-ray range JP Rueff, JM Ablett, D Céolin, D Prieur, T Moreno, V Balédent, ... Journal of synchrotron radiation 22 (1), 175-179, 2015 | 158 | 2015 |
New spectroscopy solves an old puzzle: The Kondo scale in heavy fermions C Dallera, M Grioni, A Shukla, G Vankó, JL Sarrao, JP Rueff, DL Cox Physical review letters 88 (19), 196403, 2002 | 149 | 2002 |
Anomalous Dispersion of Longitudinal Optical Phonons in Determined by Inelastic X-Ray Scattering M d'Astuto, PK Mang, P Giura, A Shukla, P Ghigna, A Mirone, M Braden, ... Physical review letters 88 (16), 167002, 2002 | 138 | 2002 |
Graphene made easy: High quality, large-area samples A Shukla, R Kumar, J Mazher, A Balan Solid State Communications 149 (17-18), 718-721, 2009 | 136 | 2009 |
Epitaxial graphene on cubic SiC (111)/Si (111) substrate A Ouerghi, A Kahouli, D Lucot, M Portail, L Travers, J Gierak, J Penuelas, ... Applied physics letters 96 (19), 2010 | 133 | 2010 |
Epitaxial graphene on 4H-SiC (0001) grown under nitrogen flux: Evidence of low nitrogen doping and high charge transfer E Velez-Fort, C Mathieu, E Pallecchi, M Pigneur, MG Silly, R Belkhou, ... ACS nano 6 (12), 10893-10900, 2012 | 118 | 2012 |
Compton scattering evidence for covalency of the hydrogen bond in ice ED Isaacs, A Shukla, PM Platzman, DR Hamann, B Barbiellini, CA Tulk Journal of Physics and Chemistry of Solids 61 (3), 403-406, 2000 | 117 | 2000 |
Anharmonic phonons in few-layer MoS: Raman spectroscopy of ultralow energy compression and shear modes M Boukhicha, M Calandra, MA Measson, O Lancry, A Shukla Physical Review B—Condensed Matter and Materials Physics 87 (19), 195316, 2013 | 107 | 2013 |
Magnetism of Invar alloys under pressure examined by inelastic X-ray scattering JP Rueff, A Shukla, A Kaprolat, M Krisch, M Lorenzen, F Sette, R Verbeni Physical Review B 63 (13), 132409, 2001 | 92 | 2001 |
Intrinsic charge transfer gap in NiO from -edge x-ray absorption spectroscopy C Gougoussis, M Calandra, A Seitsonen, C Brouder, A Shukla, F Mauri Physical Review B—Condensed Matter and Materials Physics 79 (4), 045118, 2009 | 91 | 2009 |
Momentum dependence of fluorine K-edge core exciton in LiF K Hämäläinen, S Galambosi, JA Soininen, EL Shirley, JP Rueff, A Shukla Physical Review B 65 (15), 155111, 2002 | 85 | 2002 |
Determination of pressure-induced valence changes in by resonant inelastic x-ray emission C Dallera, E Annese, JP Rueff, A Palenzona, G Vankó, L Braicovich, ... Physical Review B 68 (24), 245114, 2003 | 81 | 2003 |
High energy resolution five-crystal spectrometer for high quality fluorescence and absorption measurements on an x-ray absorption spectroscopy beamline I Llorens, E Lahera, W Delnet, O Proux, A Braillard, JL Hazemann, A Prat, ... Review of Scientific Instruments 83 (6), 2012 | 80 | 2012 |