| Probing excitonic states in ultraclean suspended two-dimensional semiconductors by photocurrent spectroscopy KIB A. R. Klots, A. K. M. Newaz, Bin Wang, D. Prasai, H. Krzyzanowska D ... Scientific Reports 4, 6608, 2014 | 477 | 2014 |
| Characterization of uranium (VI) sorption by organobentonite M Majdan, S Pikus, A Gajowiak, A Gładysz-Płaska, H Krzyżanowska, ... Applied Surface Science 256 (17), 5416-5421, 2010 | 68 | 2010 |
| Photoreflectance study of the fundamental optical properties of (Ga, Mn) As epitaxial films O Yastrubchak, J Żuk, H Krzyżanowska, JZ Domagala, T Andrearczyk, ... Physical Review B 83 (24), 245201, 2011 | 39 | 2011 |
| Electroluminescence from Er-doped SiO2/nc-Si multilayers under lateral carrier injection H Krzyżanowska, KS Ni, Y Fu, PM Fauchet Materials Science and Engineering: B 177 (17), 1547-1550, 2012 | 26 | 2012 |
| Ellipsometric study of refractive index anisotropy in porous silicon H Krzyżanowska, M Kulik, J Żuk Journal of luminescence 80 (1-4), 183-186, 1998 | 23 | 1998 |
| Electronic-and band-structure evolution in low-doped (Ga, Mn) As O Yastrubchak, J Sadowski, H Krzyżanowska, L Gluba, J Żuk, ... Journal of Applied Physics 114 (5), 2013 | 21 | 2013 |
| Apparatus and methods for probing a material as a function of depth using depth-dependent second harmonic generation J Garnett, H Krzyzanowska, NH Tolk US Patent 10,371,668, 2019 | 19 | 2019 |
| Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO2 by ion implantation J Żuk, H Krzyżanowska, MJ Clouter, M Bromberek, H Bubert, L Rebohle, ... Journal of applied physics 96 (9), 4952-4959, 2004 | 16 | 2004 |
| The photoelastic coefficient of H+ implanted GaAs as a function of defect density A Baydin, H Krzyzanowska, R Gatamov, J Garnett, N Tolk Scientific Reports 7 (1), 15150, 2017 | 15 | 2017 |
| Depth dependent modification of optical constants arising from H+ implantation in n-type 4H-SiC measured using coherent acoustic phonons A Baydin, H Krzyzanowska, M Dhanunjaya, SVS Nageswara Rao, ... APL Photonics 1 (3), 2016 | 15 | 2016 |
| Efficient energy transfer between Si nanostructures and Er located at a controlled distance H Krzyżanowska, Y Fu, KS Ni, PM Fauchet ACS Photonics 3 (4), 564-570, 2016 | 15 | 2016 |
| Energy-dependent amplitude of Brillouin oscillations in GaP A Baydin, R Gatamov, H Krzyzanowska, CJ Stanton, N Tolk Physical Review B 99 (16), 165202, 2019 | 11 | 2019 |
| Depth profiles of shallow implanted layers by soft ion sputtering and total-reflection X-ray fluorescence H Krzyżanowska, A von Bohlen, R Klockenkämper Spectrochimica Acta Part B: Atomic Spectroscopy 58 (12), 2059-2067, 2003 | 11 | 2003 |
| Hydrogen and oxygen concentration analysis of porous silicon H Krzyżanowska, AP Kobzev, J Żuk, M Kulik Journal of non-crystalline solids 354 (35-39), 4367-4374, 2008 | 10 | 2008 |
| Fluence and wavelength dependent ultrafast differential transmission dynamics in graphene R Gatamov, A Baydin, H Krzyzanowska, N Tolk Materials Research Express 7 (9), 095601, 2020 | 8 | 2020 |
| Composition of Ge+ and Si+ implanted SiO2/Si layers: Role of oxides in nanocluster formation H Krzyżanowska, H Bubert, J Żuk, W Skorupa Journal of non-crystalline solids 354 (35-39), 4363-4366, 2008 | 8 | 2008 |
| Near-surface density of ion-implanted Si studied by Rutherford backscattering and total-reflection x-ray fluorescence R Klockenkämper, M Becker, A Von Bohlen, HW Becker, H Krzyzanowska, ... Journal of applied physics 98 (3), 2005 | 8 | 2005 |
| Low temperature diamond growth arising from ultrafast pulsed-laser pretreatment H Krzyżanowska, WF Paxton, M Yilmaz, A Mayo, J Kozub, M Howell, ... Carbon 131, 120-126, 2018 | 7 | 2018 |
| Density–depth profiles of an As‐implanted Si wafer studied by repeated planar sputter etching and total reflection x‐ray fluorescence analysis R Klockenkämper, H Krzyżanowska, A von Bohlen Surface and Interface Analysis: An International Journal devoted to the …, 2003 | 7 | 2003 |
| Experimental and theoretical determination of the opto-acoustic spectrum of silicon HM Lawler, A Steigerwald, J Gregory, H Krzyzanowska, NH Tolk Materials Research Express 1 (2), 025701, 2014 | 6 | 2014 |
Andrey BaydinRice University在 rice.edu 的电子邮件经过验证
