| Symmetric linear rise and fall of conductance in a trilayer stack engineered ReRAM-based synapse K Vishwakarma, R Kishore, A Datta ACS Applied Electronic Materials 2 (10), 3263-3269, 2020 | 8 | 2020 |
| Impact of nonuniform ozone anneal treatment on the resistance levels in an igzo-reram fabricated on ito coated glass substrate R Kishore, K Vishwakarma, A Datta IEEE Transactions on Electron Devices, 1-7, 2021 | 6 | 2021 |
| Sub-pico-second hole generation lifetime in thin film IGZO sputtered and annealed on p-silicon substrate R Kishore, K Vishwakarma, A Datta IEEE Transactions on Nanotechnology 20, 392-399, 2021 | 4 | 2021 |
| Lossy data compression using Logarithm V Kumar, S Barthwal, R Kishore, R Saklani, A Sharma, S Sharma arXiv preprint arXiv:1604.02035, 2016 | 3 | 2016 |
| Indium–Gallium–Zinc Oxide (IGZO)-based ReRAM: Material Overview, Latest Development and Technology Perspective A Datta, R Kishore, K Vishwakarma | 2 | 2023 |
| Effect of Non-identical Annealing on the Breakdown Characteristics of Sputtered IGZO Films R Kishore, K Vishwakarma, A Datta IEEE International Reliability Physics Symposium (IRPS), 2022 | 1 | 2022 |
| Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability K Vishwakarma, R Kishore, A Datta IEEE Transactions on Device and Materials Reliability 21 (4), 587-593, 2021 | 1 | 2021 |
| Pulsed Low-Frequency Noise Characterization on Al/ZnO/Al ReRAM to Investigate the Role of Deep-Level Oxygen Vacancy State in HRS Leakage K Vishwakarma, R Kishore, A Datta IEEE Transactions on Electron Devices, 2023 | | 2023 |
| Spectral Response of Solar Blind MSM Photodetector With InGaZnO Film Sputter Deposited in Diluted Oxygen Ambience R Kishore, K Vishwakarma, A Datta IEEE Journal of Quantum Electronics 59 (4), 1-7, 2023 | | 2023 |
| Distribution of Process Induced Traps in Ozone Annealed Indium-Gallium-Zinc-Oxide Film Determined From Noise Characterization R Kishore, K Vishwakarma, H Vaibhav, A Datta IEEE Electron Device Letters 44 (5), 797-800, 2023 | | 2023 |
| Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks K Vishwakarma, R Kishore, S Gora, M Jangra, A Datta 2023 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2023 | | 2023 |
| Formation of Remote Quantum Point Contact Inside Dielectric Medium of an AlOx/SiOx ReRAM K Vishwakarma, R Kishore, A Datta IEEE Transactions on Electron Devices 69 (12), 6738-6744, 2022 | | 2022 |
| Impact of Bias Temperature Stress on IGZO/Ni/IGZO Steep Subthreshold Vertical Current Driver Fabricated at Room Temperature R Kishore, K Vishwakarma, A Datta IEEE Transactions on Device and Materials Reliability 21 (2), 273-278, 2021 | | 2021 |
Kavita VishwakarmaInter-University Microelectronics Center在 imec.be 的电子邮件经过验证
Kavita VishwakarmaInter-University Microelectronics Center在 imec.be 的电子邮件经过验证