| A highly robust and low-power real-time double node upset self-healing latch for radiation-prone applications S Kumar, A Mukherjee IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (12 …, 2021 | 29 | 2021 |
| A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design S Kumar, A Mukherjee IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2021 | 13 | 2021 |
| A triple-node upset self-healing latch for high speed and robust operation in radiation-prone harsh-environment S Kumar, A Mukherjee Microelectronics Reliability 139, 114857, 2022 | 10 | 2022 |
| Design of soft-error resilient SRAM cell with high read and write stability for robust operations S Kumar, A Mukherjee AEU-International Journal of Electronics and Communications 168, 154719, 2023 | 8 | 2023 |
| High performance radiation-hardened SRAM cell design for robust applications S Kumar, A Mukherjee Microelectronics Journal 140, 105934, 2023 | 1 | 2023 |
| Low cost and high performance double-node upset resilient latch for low orbit space applications S Kumar, A Mukherjee International Journal of Circuit Theory and Applications, 2023 | | 2023 |
| Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications AK Samal, S Kumar, A Mukherjee 2023 IEEE International Test Conference in Asia (ITC-Asia), 1-5, 2023 | | 2023 |
Atin MukherjeeAssistant Professor, National Institute of Technology Rourkela在 nitrkl.ac.in 的电子邮件经过验证
Atin MukherjeeAssistant Professor, National Institute of Technology Rourkela在 nitrkl.ac.in 的电子邮件经过验证