| Review of THz-based semiconductor assurance J True, C Xi, N Jessurun, K Ahi, N Asadizanjani Optical Engineering 60 (6), 060901-060901, 2021 | 34 | 2021 |
| Terahertz based machine learning approach to integrated circuit assurance J True, C Xi, N Jessurun, K Ahi, M Tehranipoor, N Asadizanjani 2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2235-2245, 2021 | 11 | 2021 |
| FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection D Mehta, J True, OP Dizon-Paradis, N Jessurun, DL Woodard, ... Cryptology ePrint Archive, 2022 | 8 | 2022 |
| Machine learning assisted counterfeit ic detection through non-destructive infrared (ir) spectroscopy material characterization C Xi, N Jessurun, J True, AA Khan, MM Tehranipoor, N Asadizanjani 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 2249-2255, 2022 | 6 | 2022 |
| QUAINTPEAX QUantifying algorithmically INTrinsic properties of electronic assemblies via X-ray CT J True, N Jessurun, D Mehta, N Asadi Microscopy and Microanalysis 27 (S1), 1222-1225, 2021 | 5 | 2021 |
| An overview of 3D X-ray reconstruction algorithms for PCB inspection A Roberts, J True, NT Jessurun, DN Asadizanjani International Symposium for Testing and Failure Analysis 83348, 188-197, 2020 | 5 | 2020 |
| High-resolution Terahertz near-field reflection measurements for complementary non-destructive inspection of integrated circuits A Michalski, S Sawallich, J True, N Asadizanjani, M Nagel 2021 46th International Conference on Infrared, Millimeter and Terahertz …, 2021 | 3 | 2021 |
| Revisiting 3D-X-ray for rapid reverse engineering in large electronic packages and PCBs J True, W Yun, J Gelb, S Gul, D Vine, S Lewis, D Johnson, SH Lau 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2022 | 2 | 2022 |
| Digital twin aided IC packaging structure analysis for high-quality sample preparation C Xi, AA Khan, J True, N Vashistha, N Jessurun, N Asadizanjani 2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021 | 2 | 2021 |
| Physical Inspection and Attacks on Electronics: An Academic Course for the Hardware Cybersecurity Workforce J True, N Asadizanjani IEEE Security & Privacy 21 (2), 63-69, 2023 | 1 | 2023 |
| Geometry Aware X-ray Imaging and Reconstruction for PCB Assurance J True, N Jessurun, M Tehranipoor, N Asadizanjani Proceedings of the Government Microcircuit Applications and Critical …, 2021 | 1 | 2021 |
| Printed circuit board obfuscation systems and methods N Asadi-Zanjani, T John, C Xi, A Khan US Patent App. 18/463,988, 2024 | | 2024 |
| Digital twin modeling of ic packaging structure N Asadi-Zanjani, T John, C Xi US Patent App. 18/054,623, 2023 | | 2023 |
| Terahertz data collection for electronic object classification and evaluation N Asadi-Zanjani, T John, N Jessurun, C Xi US Patent App. 17/664,596, 2023 | | 2023 |
| PCB Netlist Obfuscation with Micro Electro Mechanical Systems and Additive Manufacturing Techniques J True, C Xi, A Khan, J Hihath, N Asadizanjani International Symposium for Testing and Failure Analysis 84215, 172-178, 2021 | | 2021 |
