Modified desirability functions for multiple response optimization E Del Castillo, DC Montgomery, DR McCarville Journal of quality technology 28 (3), 337-345, 1996 | 584 | 1996 |
Process optimization: a statistical approach E del Castillo Elsevier, 2008 | 512* | 2008 |
A nonlinear programming solution to the dual response problem E Del Castillo, DC Montgomery Journal of Quality Technology 25 (3), 199-204, 1993 | 446 | 1993 |
Fitting the generalized Pareto distribution to data E Castillo, AS Hadi Journal of the American Statistical Association 92 (440), 1609-1620, 1997 | 430 | 1997 |
Run-to-run control in semiconductor manufacturing J Moyne Encyclopedia of Systems and Control, 1997-2003, 2021 | 372 | 2021 |
Run-to-run process control: Literature review and extensions E Del Castillo, AM Hurwitz Journal of Quality Technology 29 (2), 184-196, 1997 | 357 | 1997 |
Statistical process adjustment for quality control, 2002 E Del Castillo Wiley: New York, 0 | 294* | |
NIST/SEMATECH e-Handbook of Statistical Methods M Natrella | 257 | 2010 |
Response surface methodology and related topics AI Khuri World scientific, 2006 | 238 | 2006 |
An adaptive run-to-run optimizing controller for linear and nonlinear semiconductor processes E Del Castillo, JY Yeh IEEE Transactions on Semiconductor Manufacturing 11 (2), 285-295, 1998 | 155 | 1998 |
Optimal short horizon distribution operations in reusable container systems ED Castillo, JK Cochran Journal of the Operational Research Society 47 (1), 48-60, 1996 | 142 | 1996 |
Long run and transient analysis of a double EWMA feedback controller ED Castillo IIE transactions 31 (12), 1157-1169, 1999 | 131 | 1999 |
A Bayesian approach for multiple response surface optimization in the presence of noise variables G Miró-Quesada, E Del Castillo, JJ Peterson Journal of applied statistics 31 (3), 251-270, 2004 | 121 | 2004 |
Economic modeling for statistical process control JB Keats, E Del Castillo, E Von Collani, EM Saniga Journal of Quality Technology 29 (2), 144-147, 1997 | 112 | 1997 |
A multivariate double EWMA process adjustment scheme for drifting processes E Del Castillo, R Rajagopal Iie Transactions 34 (12), 1055-1068, 2002 | 101 | 2002 |
Bayesian process monitoring, control and optimization BM Colosimo, E Del Castillo CRC Press, 2006 | 94* | 2006 |
Short‐run statistical process control: Q‐chart enhancements and alternative methods ED Castillo, DC Montgomery Quality and Reliability Engineering International 10 (2), 87-97, 1994 | 85 | 1994 |
Multiresponse process optimization via constrained confidence regions E Del Castillo Journal of Quality Technology 28 (1), 61-70, 1996 | 84 | 1996 |
Some properties of EWMA feedback quality adjustment schemes for drifting disturbances E Del Castillo Journal of quality technology 33 (2), 153-166, 2001 | 82 | 2001 |
Query-by-committee improvement with diversity and density in batch active learning S Kee, E Del Castillo, G Runger Information Sciences 454, 401-418, 2018 | 78 | 2018 |