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Philippe T. Pinard
Philippe T. Pinard
Oxford Instruments
在 oxinst.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Characterization of dual-phase steel microstructure by combined submicrometer EBSD and EPMA carbon measurements
PT Pinard, A Schwedt, A Ramazani, U Prahl, S Richter
Microscopy and microanalysis 19 (4), 996-1006, 2013
1002013
Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering
X Llovet, A Moy, PT Pinard, JH Fournelle
Progress in Materials Science 120, 100818, 2021
862021
Persulfate initiated ultra-low cross-linked poly (N-isopropylacrylamide) microgels possess an unusual inverted cross-linking structure
OLJ Virtanen, A Mourran, PT Pinard, W Richtering
Soft matter 12 (17), 3919-3928, 2016
772016
Characterisation of microstructure and modelling of flow behaviour of bainite-aided dual-phase steel
A Ramazani, PT Pinard, S Richter, A Schwedt, U Prahl
Computational materials science 80, 134-141, 2013
762013
Secondary fluorescence in electron probe microanalysis of material couples
X Llovet, PT Pinard, JJ Donovan, F Salvat
Journal of Physics D: Applied Physics 45 (22), 225301, 2012
672012
Analysis of WC/Ni-based coatings deposited by controlled short-circuit MIG welding
P Vespa, PT Pinard, R Gauvin, M Brochu
Journal of materials engineering and performance 21, 865-876, 2012
402012
Towards a more comprehensive microstructural analysis of Zr–2.5 Nb pressure tubing using image analysis and electron backscattered diffraction (EBSD)
P Hovington, PT Pinard, M Lagacé, L Rodrigue, R Gauvin, ML Trudeau
Journal of Nuclear Materials 393 (1), 162-174, 2009
322009
Electron probe microanalysis of Ni silicides using Ni-L X-ray lines
X Llovet, PT Pinard, E Heikinheimo, S Louhenkilpi, S Richter
Microscopy and Microanalysis 22 (6), 1233-1243, 2016
272016
Development and validation of standardless and standards-based X-ray microanalysis
PT Pinard, A Protheroe, J Holland, S Burgess, PJ Statham
IOP Conference Series: Materials Science and Engineering 891 (1), 012020, 2020
182020
An open-source engine for the processing of electron backscatter patterns: EBSD-Image
PT Pinard, M Lagacé, P Hovington, D Thibault, R Gauvin
Microscopy and Microanalysis 17 (3), 374-385, 2011
182011
Low voltage EPMA: experiments on a new frontier in microanalysis-analytical lateral resolution
J Fournelle, H Cathey, PT Pinard, S Richter
IOP Conference Series: Materials Science and Engineering 109 (1), 012003, 2016
152016
Improving the quantification at high spatial resolution using a field emission electron microprobe
PT Pinard, S Richter
IOP Conference Series: Materials Science and Engineering 55 (1), 012016, 2014
142014
Deformation behavior of high-manganese TWIP steels produced by twin-roll strip casting
M Daamen, W Nessen, PT Pinard, S Richter, A Schwedt, G Hirt
Procedia Engineering 81, 1535-1540, 2014
112014
Electron probe microanalysis of carbon containing steels at a high spatial resolution
PT Pinard, R Gauvin, JM Schneider, J Mayer
Fachgruppe für Materialwissenschaft und Werkstofftechnik, 2017
92017
PyPenelope
PT Pinard, H Demers, F Salvat, R Gauvin
Tech. Rep., Oct., 2016.[Online]. Available: https://pypenelope. sourceforge. net, 2006
92006
Quantitative evaluation of metallographic preparation quality using EBSD
PT Pinard, P Hovington, M Lagacé, GM Lucas, GV Voort, R Gauvin
Microscopy and Microanalysis 15 (2), 778, 2009
82009
X-ray microanalysis at high count rate with latest generation silicon drift energy dispersive spectrometer
PT Pinard, S Burgess, JQ Zhang, J Holland, P Statham
Microscopy and Microanalysis 24 (S1), 724-725, 2018
62018
Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities
E Heikinheimo, PT Pinard, S Richter, X Llovet, S Louhenkilpi
IOP Conference Series: Materials Science and Engineering 109 (1), 012005, 2016
62016
Combined EPMA, FIB and Monte Carlo simulation: A versatile tool for quantitative analysis of multilayered structures
S Richter, PT Pinard
IOP Conference Series: Materials Science and Engineering 109 (1), 012014, 2016
62016
Quantification of low concentration elements using soft X-rays at high spatial resolution
PT Pinard, S Richter
IOP Conference Series: Materials Science and Engineering 109 (1), 012013, 2016
62016
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