| The role of charge trapping in MoS2/SiO2 and MoS2/hBN field-effect transistors YY Illarionov, G Rzepa, M Waltl, T Knobloch, A Grill, MM Furchi, T Mueller, ... 2D Materials 3 (3), 035004, 2016 | 216 | 2016 |
| Long-term stability and reliability of black phosphorus field-effect transistors YY Illarionov, M Waltl, G Rzepa, JS Kim, S Kim, A Dodabalapur, ... ACS nano 10 (10), 9543-9549, 2016 | 185 | 2016 |
| Comphy—A compact-physics framework for unified modeling of BTI G Rzepa, J Franco, B O’Sullivan, A Subirats, M Simicic, G Hellings, ... Microelectronics Reliability 85, 49-65, 2018 | 180 | 2018 |
| Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence W Goes, Y Wimmer, AM El-Sayed, G Rzepa, M Jech, AL Shluger, ... Microelectronics Reliability 87, 286-320, 2018 | 130 | 2018 |
| On the microscopic structure of hole traps in pMOSFETs T Grasser, W Goes, Y Wimmer, F Schanovsky, G Rzepa, M Waltl, K Rott, ... 2014 IEEE International Electron Devices Meeting, 21.1. 1-21.1. 4, 2014 | 116 | 2014 |
| Energetic mapping of oxide traps in MoS2 field-effect transistors YY Illarionov, T Knobloch, M Waltl, G Rzepa, A Pospischil, DK Polyushkin, ... 2D Materials 4 (2), 025108, 2017 | 66 | 2017 |
| A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability B Kaczer, J Franco, P Weckx, PJ Roussel, V Putcha, E Bury, M Simicic, ... Microelectronics Reliability 81, 186-194, 2018 | 65 | 2018 |
| Highly-stable black phosphorus field-effect transistors with low density of oxide traps YY Illarionov, M Waltl, G Rzepa, T Knobloch, JS Kim, D Akinwande, ... npj 2D Materials and Applications 1 (1), 23, 2017 | 64 | 2017 |
| A Physical Model for the Hysteresis in MoS2 Transistors T Knobloch, G Rzepa, YY Illarionov, M Waltl, F Schanovsky, B Stampfer, ... IEEE Journal of the Electron Devices Society 6, 972-978, 2018 | 60 | 2018 |
| Gate-sided hydrogen release as the origin of" permanent" NBTI degradation: From single defects to lifetimes T Grasser, M Waltl, Y Wimmer, W Goes, R Kosik, G Rzepa, H Reisinger, ... 2015 IEEE International Electron Devices Meeting (IEDM), 20.1. 1-20.1. 4, 2015 | 58 | 2015 |
| On the characterization and separation of trapping and ferroelectric behavior in HfZrO FET MNK Alam, B Kaczer, LÅ Ragnarsson, M Popovici, G Rzepa, N Horiguchi, ... IEEE Journal of the Electron Devices Society 7, 855-862, 2019 | 53 | 2019 |
| Complete extraction of defect bands responsible for instabilities in n and pFinFETs G Rzepa, M Waltl, W Goes, B Kaczer, J Franco, T Chiarella, N Horiguchi, ... 2016 IEEE Symposium on VLSI Technology, 1-2, 2016 | 38 | 2016 |
| The “permanent” component of NBTI revisited: Saturation, degradation-reversal, and annealing T Grasser, M Waltl, G Rzepa, W Goes, Y Wimmer, AM El-Sayed, ... 2016 IEEE International Reliability Physics Symposium (IRPS), 5A-2-1-5A-2-8, 2016 | 37 | 2016 |
| Vertically stacked nanowire MOSFETs for sub-10nm nodes: Advanced topography, device, variability, and reliability simulations M Karner, O Baumgartner, Z Stanojević, F Schanovsky, G Strof, ... 2016 IEEE International Electron Devices Meeting (IEDM), 30.7. 1-30.7. 4, 2016 | 35 | 2016 |
| Efficient physical defect model applied to PBTI in high-κ stacks G Rzepa, J Franco, A Subirats, M Jech, A Chasin, A Grill, M Waltl, ... 2017 IEEE International Reliability Physics Symposium (IRPS), XT-11.1-XT-11.6, 2017 | 34 | 2017 |
| NBTI modeling in analog circuits and its application to long-term aging simulations KU Giering, C Sohrmann, G Rzepa, L Heiß, T Grasser, R Jancke 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW …, 2014 | 34 | 2014 |
| Superior NBTI in High- SiGe Transistors–Part I: Experimental M Waltl, G Rzepa, A Grill, W Goes, J Franco, B Kaczer, L Witters, J Mitard, ... IEEE Transactions on Electron Devices 64 (5), 2092-2098, 2017 | 30 | 2017 |
| Microscopic oxide defects causing BTI, RTN, and SILC on high-k FinFETs G Rzepa, M Waltl, W Goes, B Kaczer, T Grasser 2015 International Conference on Simulation of Semiconductor Processes and …, 2015 | 29 | 2015 |
| Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space: Implications and Peculiarities M Jech, G Rott, H Reisinger, S Tyaginov, G Rzepa, A Grill, D Jabs, ... IEEE Transactions on Electron Devices 67 (8), 3315-3322, 2020 | 27 | 2020 |
| Physical modeling of bias temperature instabilities in SiC MOSFETs C Schleich, J Berens, G Rzepa, G Pobegen, G Rescher, S Tyaginov, ... 2019 IEEE International Electron Devices Meeting (IEDM), 20.5. 1-20.5. 4, 2019 | 27 | 2019 |
