| Highly sensitive detection of surface and intercalated impurities in graphene by LEIS S Průša, P Procházka, P Bábor, T Šikola, R ter Veen, M Fartmann, ... Langmuir 31 (35), 9628-9635, 2015 | 47 | 2015 |
| Sn–CeO2 thin films prepared by rf magnetron sputtering: XPS and SIMS study K Mašek, M Václavů, P Bábor, V Matolín Applied Surface Science 255 (13-14), 6656-6660, 2009 | 46 | 2009 |
| Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process M Urbánek, V Uhlíř, P Bábor, E Kolíbalová, T Hrnčíř, J Spousta, T Šikola Nanotechnology 21 (14), 145304, 2010 | 42 | 2010 |
| Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques B Ber, P Bábor, PN Brunkov, P Chapon, MN Drozdov, R Duda, ... Thin Solid Films 540, 96-105, 2013 | 31 | 2013 |
| Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers N Daghbouj, M Callisti, HS Sen, M Karlik, J Čech, M Vronka, V Havránek, ... Acta Materialia 202, 317-330, 2021 | 26 | 2021 |
| High-resolution characterization of hexagonal boron nitride coatings exposed to aqueous and air oxidative environments L Jiang, N Xiao, B Wang, E Grustan-Gutierrez, X Jing, P Babor, M Kolíbal, ... Nano Research 10, 2046-2055, 2017 | 26 | 2017 |
| Formation of copper islands on a native SiO2 surface at elevated temperatures J Čechal, J Polčák, M Kolíbal, P Bábor, T Šikola Applied surface science 256 (11), 3636-3641, 2010 | 20 | 2010 |
| FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources FA Stevie, L Sedlacek, P Babor, J Jiruse, E Principe, K Klosova Surface and Interface Analysis 46 (S1), 285-287, 2014 | 17 | 2014 |
| Real-time observation of self-limiting SiO 2/Si decomposition catalysed by gold silicide droplets P Bábor, R Duda, J Polčák, S Průša, M Potoček, P Varga, J Čechal, ... RSC advances 5 (123), 101726-101731, 2015 | 16 | 2015 |
| Interface-driven strain in heavy ion-irradiated Zr/Nb nanoscale metallic multilayers: validation of distortion modeling via local strain mapping HS Sen, N Daghbouj, M Callisti, M Vronka, M Karlík, J Duchoň, J Čech, ... ACS Applied Materials & Interfaces 14 (10), 12777-12796, 2022 | 13 | 2022 |
| Deposition and in-situ characterization of ultra-thin films S Voborný, M Kolı́bal, J Mach, J Čechal, P Bábor, S Průša, J Spousta, ... Thin solid films 459 (1-2), 17-22, 2004 | 11 | 2004 |
| Electron emission from H-terminated diamond enhanced by polypyrrole grafting E Ukraintsev, A Kromka, W Janssen, K Haenen, D Takeuchi, P Bábor, ... Carbon 176, 642-649, 2021 | 8 | 2021 |
| In situ analysis of Ga-ultrathin films by TOF-LEIS M Kolíbal, S Průša, M Plojhar, P Bábor, M Potoček, O Tomanec, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 8 | 2006 |
| Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling P Bábor, R Duda, S Průša, T Matlocha, M Kolíbal, J Čechal, M Urbánek, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2011 | 6 | 2011 |
| A study of a LEIS azimuthal scan behavior: Classical dynamics simulation T Matlocha, S Průša, M Kolíbal, P Bábor, D Primetzhofer, SN Markin, ... Surface science 604 (21-22), 1906-1911, 2010 | 6 | 2010 |
| Angle‐resolved XPS depth profiling of modeled structures: testing and improvement of the method J Polčák, J Čechal, P Bábor, M Urbánek, S Průša, T Šikola Surface and Interface Analysis 42 (6‐7), 649-652, 2010 | 6 | 2010 |
| A study of Ga layers on Si (1 0 0)-(2× 1) by SR-PES: Influence of adsorbed water J Čechal, J Mach, S Voborný, P Kostelník, P Bábor, J Spousta, T Šikola Surface science 601 (9), 2047-2053, 2007 | 6 | 2007 |
| TOF–LEIS analysis of ultra thin films: Ga and Ga-N layer growth on Si (1 1 1) M Kolı́bal, S Průša, P Bábor, T Šikola Surface science 566, 885-889, 2004 | 6 | 2004 |
| Radiation damage evolution in pure W and W-Cr-Hf alloy caused by 5 MeV Au ions in a broad range of dpa A Macková, S Fernandes, J Matejíček, M Vilémová, V Holý, MO Liedke, ... Nuclear Materials and Energy 29, 101085, 2021 | 5 | 2021 |
| Low energy ion scattering as a depth profiling tool for thin layers-Case of bromine methanol etched CdTe O Šik, P Bábor, J Polčák, E Belas, P Moravec, L Grmela, J Staněk Vacuum 152, 138-144, 2018 | 5 | 2018 |
Jan ČechalBrno University of Technology在 fme.vutbr.cz 的电子邮件经过验证
