| High-dimensional process monitoring and fault isolation via variable selection K Wang, W Jiang Journal of Quality Technology 41 (3), 247-258, 2009 | 190 | 2009 |
| Using profile monitoring techniques for a data‐rich environment with huge sample size K Wang, F Tsung Quality and reliability engineering international 21 (7), 677-688, 2005 | 180 | 2005 |
| A variable-selection-based multivariate EWMA chart for process monitoring and diagnosis W Jiang, K Wang, F Tsung Journal of Quality Technology 44 (3), 209-230, 2012 | 101 | 2012 |
| A review of reliability research on nanotechnology SL Jeng, JC Lu, K Wang IEEE Transactions on reliability 56 (3), 401-410, 2007 | 81 | 2007 |
| A review of statistical methods for quality improvement and control in nanotechnology JC Lu, SL Jeng, K Wang Journal of Quality Technology 41 (2), 148-164, 2009 | 73 | 2009 |
| Monitoring the covariance matrix via penalized likelihood estimation B Li, K Wang, AB Yeh IIE Transactions 45 (2), 132-146, 2013 | 59 | 2013 |
| Monitoring wafers’ geometric quality using an additive Gaussian process model L Zhang, K Wang, N Chen IIE Transactions 48 (1), 1-15, 2016 | 57 | 2016 |
| Statistical surface monitoring by spatial-structure modeling A Wang, K Wang, F Tsung Journal of Quality Technology 46 (4), 359-376, 2014 | 57 | 2014 |
| CUSUM and EWMA multi-charts for detecting a range of mean shifts D Han, F Tsung, X Hu, K Wang Statistica Sinica, 1139-1164, 2007 | 52 | 2007 |
| Adaptive charting techniques: literature review and extensions F Tsung, K Wang Frontiers in Statistical Quality Control 9, 19-35, 2010 | 45 | 2010 |
| Simultaneous monitoring of process mean vector and covariance matrix via penalized likelihood estimation K Wang, AB Yeh, B Li Computational Statistics & Data Analysis 78, 206-217, 2014 | 44 | 2014 |
| Monitoring multivariate process variability with individual observations via penalised likelihood estimation AB Yeh, B Li, K Wang International Journal of Production Research 50 (22), 6624-6638, 2012 | 43 | 2012 |
| Run-to-run process adjustment using categorical observations K Wang, F Tsung Journal of Quality Technology 39 (4), 312-325, 2007 | 40 | 2007 |
| A hierarchical model for characterising spatial wafer variations L Bao, K Wang, R Jin International Journal of Production Research 52 (6), 1827-1842, 2014 | 28 | 2014 |
| An Adaptive T2 Chart for Monitoring Dynamic Systems K Wang, F Tsung Journal of Quality Technology 40 (1), 109-123, 2008 | 27 | 2008 |
| Process adjustment with an asymmetric quality loss function J Zhang, W Li, K Wang, R Jin Journal of Manufacturing Systems 33 (1), 159-165, 2014 | 25 | 2014 |
| A general harmonic rule controller for run-to-run process control F He, K Wang, W Jiang IEEE Transactions on Semiconductor Manufacturing 22 (2), 232-244, 2009 | 25 | 2009 |
| Monitoring feedback-controlled processes using adaptive T 2 schemes K Wang, F Tsung International Journal of Production Research 45 (23), 5601-5619, 2007 | 23 | 2007 |
| Monitoring profile trajectories with dynamic time warping alignment C Dai, K Wang, R Jin Quality and Reliability Engineering International 30 (6), 815-827, 2014 | 20 | 2014 |
| A run-to-run profile control algorithm for improving the flatness of nano-scale products X Wang, S Wu, K Wang IEEE Transactions on Automation Science and Engineering 12 (1), 192-203, 2013 | 16 | 2013 |
Fugee Tsung, Fellow of ASA, ASQ, IIS...Chair Professor, HKUST在 ust.hk 的电子邮件经过验证
