| Quantum-coupled borophene-based heterolayers for excitonic and molecular sensing applications K Vishwakarma, S Rani, S Chahal, CY Lu, SJ Ray, CS Yang, P Kumar Physical Chemistry Chemical Physics 24 (21), 12816-12826, 2022 | 28 | 2022 |
| Rheological and mechanical properties of PMMA/organoclay nanocomposites prepared via ultrasound-assisted in-situ emulsion polymerization MK Poddar, K Vishwakarma, VS Moholkar Korean Journal of Chemical Engineering 36, 828-836, 2019 | 13 | 2019 |
| Ultrasound assisted synthesis of polymer nanocomposites: a review V Soman, K Vishwakarma, MK Poddar Journal of Polymer Research 30 (11), 406, 2023 | 8 | 2023 |
| Symmetric Linear Rise and Fall of Conductance in a Trilayer Stack Engineered ReRAM-Based Synapse K Vishwakarma, R kishore, A Datta ACS Applied Electronic Materials 2 (10), 3263-3269, 2020 | 8 | 2020 |
| Impact of nonuniform ozone anneal treatment on the resistance levels in an IGZO-ReRAM fabricated on ITO-coated glass substrate R Kishore, K Vishwakarma, A Datta IEEE Transactions on Electron Devices 68 (12), 6087-6093, 2021 | 7 | 2021 |
| Sub-pico-second hole generation lifetime in thin film IGZO sputtered and annealed on p-silicon substrate R Kishore, K Vishwakarma, A Datta IEEE Transactions on Nanotechnology 20, 392-399, 2021 | 4 | 2021 |
| Indium–Gallium–Zinc Oxide (IGZO)-based ReRAM: Material Overview, Latest Development and Technology Perspective A Datta, R Kishore, K Vishwakarma | 2 | 2023 |
| Distribution of Process Induced Traps in Ozone Annealed Indium-Gallium-Zinc-Oxide Film Determined from Noise Characterization R Kishore, K Vishwakarma, H Vaibhav, A Datta IEEE Electron Device Letters, 2023 | 1 | 2023 |
| Effect of Non-identical Annealing on the Breakdown Characteristics of Sputtered IGZO Films R Kishore*, K Vishwakarma*, A Datta 2022 IEEE International Reliability Physics Symposium (IRPS), P24-1-P24-4, 2022 | 1 | 2022 |
| Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability K Vishwakarma, R Kishore, A Datta IEEE Transactions on Device and Materials Reliability 21 (4), 587-593, 2021 | 1 | 2021 |
| Gate oxide reliability: upcoming trends, challenges, and opportunities B Kaczer, R Degraeve, J Franco, T Grasser, PJ Roussel, E Bury, P Weckx, ... 2024 IEEE Silicon Nanoelectronics Workshop (SNW), 3-4, 2024 | | 2024 |
| Pulsed Low-Frequency Noise Characterization on Al/ZnO/Al ReRAM to Investigate the Role of Deep-Level Oxygen Vacancy State in HRS Leakage K Vishwakarma, R Kishore, A Datta IEEE Transactions on Electron Devices, 2023 | | 2023 |
| Spectral Response of Solar Blind MSM Photodetector With InGaZnO Film Sputter Deposited in Diluted Oxygen Ambience R Kishore, K Vishwakarma, A Datta IEEE Journal of Quantum Electronics 59 (4), 1-7, 2023 | | 2023 |
| Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks K Vishwakarma, R Kishore, S Gora, M Jangra, A Datta 2023 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2023 | | 2023 |
| Formation of Remote Quantum Point Contact Inside Dielectric Medium of an AlOx/SiOx ReRAM K Vishwakarma, R Kishore, A Datta IEEE Transactions on Electron Devices 69 (12), 6738-6744, 2022 | | 2022 |
| Impact of Bias Temperature Stress on IGZO/Ni/IGZO Steep Subthreshold Vertical Current Driver Fabricated at Room Temperature R Kishore, K Vishwakarma, A Datta IEEE Transactions on Device and Materials Reliability 21 (2), 273-278, 2021 | | 2021 |
