Surface and grain-boundary scattering in nanometric Cu films T Sun, B Yao, AP Warren, K Barmak, MF Toney, RE Peale, KR Coffey Phys. Rev. B 81 (15), 155454-1, 2010 | 234 | 2010 |
Comparison of the agglomeration behavior of thin metallic films on SiO2 PR Gadkari, AP Warren, RM Todi, RV Petrova, KR Coffey Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 23 (4 …, 2005 | 189 | 2005 |
Dominant role of grain boundary scattering in the resistivity of nanometric Cu films T Sun, B Yao, AP Warren, K Barmak, MF Toney, RE Peale, KR Coffey Physical Review B 79 (4), 041402, 2009 | 137 | 2009 |
Phase, grain structure, stress, and resistivity of sputter-deposited tungsten films D Choi, B Wang, S Chung, X Liu, A Darbal, A Wise, NT Nuhfer, K Barmak, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 29 (5 …, 2011 | 127 | 2011 |
Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films D Choi, CS Kim, D Naveh, S Chung, AP Warren, NT Nuhfer, MF Toney, ... Physical Review B 86 (4), 045432, 2012 | 99 | 2012 |
Surface and grain boundary scattering in nanometric Cu thin films: A quantitative analysis including twin boundaries K Barmak, A Darbal, KJ Ganesh, PJ Ferreira, JM Rickman, T Sun, B Yao, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 32 (6 …, 2014 | 92 | 2014 |
Classical size effect in oxide-encapsulated Cu thin films: Impact of grain boundaries versus surfaces on resistivity T Sun, B Yao, AP Warren, V Kumar, S Roberts, K Barmak, KR Coffey Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 26 (4 …, 2008 | 62 | 2008 |
Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps AD Darbal, KJ Ganesh, X Liu, SB Lee, J Ledonne, T Sun, B Yao, ... Microscopy and Microanalysis 19 (1), 111-119, 2013 | 56 | 2013 |
Aluminum Impurity Diffusion in Magnesium S Brennan, AP Warren, KR Coffey, N Kulkarni, P Todd, M Kilmov, Y Sohn Journal of phase equilibria and diffusion 33 (2), 121-125, 2012 | 48 | 2012 |
High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification B Yao, T Sun, A Warren, H Heinrich, K Barmak, KR Coffey Micron 41 (3), 177-182, 2010 | 48 | 2010 |
Dual band sensitivity enhancements of a VO x microbolometer array using a patterned gold black absorber EM Smith, D Panjwani, J Ginn, AP Warren, C Long, P Figuieredo, C Smith, ... Applied Optics 55 (8), 2071-2078, 2016 | 46 | 2016 |
Experimental study of interaction of laser radiation with silver nanoparticles in SiO2 matrix M Sendova, M Sendova-Vassileva, JC Pivin, H Hofmeister, K Coffey, ... Journal of nanoscience and nanotechnology 6 (3), 748-755, 2006 | 46 | 2006 |
Investigation of oxygen annealing effects on RF sputter deposited SiC thin films RM Todi, KB Sundaram, AP Warren, K Scammon Solid-state electronics 50 (7-8), 1189-1193, 2006 | 27 | 2006 |
Characterization of Pt-Ru binary alloy thin films for work function tuning RM Todi, AP Warren, KB Sundaram, K Barmak, KR Coffey IEEE electron device letters 27 (7), 542-545, 2006 | 22 | 2006 |
Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film X Liu, AP Warren, NT Nuhfer, AD Rollett, KR Coffey, K Barmak Acta Materialia 79, 138-145, 2014 | 19 | 2014 |
Linear bolometer array using a high TCR VOx-Au film EM Smith, JC Ginn, AP Warren, CJ Long, D Panjwani, RE Peale, ... Infrared Technology and Applications XL 9070, 90701Z, 2014 | 19 | 2014 |
X-ray photoelectron spectroscopy analysis of oxygen annealed radio frequency sputter deposited SiCN thin films RM Todi, AP Warren, KB Sundaram, KR Coffey Journal of The Electrochemical Society 153 (7), G640-G643, 2006 | 19 | 2006 |
Grain size dependence of the twin length fraction in nanocrystalline Cu thin films via transmission electron microscopy based orientation mapping X Liu, NT Nuhfer, AP Warren, KR Coffey, GS Rohrer, K Barmak Journal of Materials Research 30 (4), 528-537, 2015 | 17 | 2015 |
Photoluminescence from RF sputtered SiCBN thin films A Vijayakumar, AP Warren, RM Todi, KB Sundaram Journal of Materials Science: Materials in Electronics 20 (2), 144-148, 2009 | 15 | 2009 |
On twin density and resistivity of nanometric Cu thin films K Barmak, X Liu, A Darbal, NT Nuhfer, D Choi, T Sun, AP Warren, ... Journal of Applied Physics 120 (6), 065106, 2016 | 14 | 2016 |