| Order of magnitude signal gain in magnetic sector mass spectrometry via aperture coding EX Chen, ZE Russell, JJ Amsden, SD Wolter, RM Danell, CB Parker, ... Journal of The American Society for Mass Spectrometry 26 (9), 1633-1640, 2015 | 30 | 2015 |
| Two-dimensional aperture coding for magnetic sector mass spectrometry ZE Russell, EX Chen, JJ Amsden, SD Wolter, RM Danell, CB Parker, ... Journal of The American Society for Mass Spectrometry 26 (2), 248-256, 2014 | 24 | 2014 |
| Proof of concept coded aperture miniature mass spectrometer using a cycloidal sector mass analyzer, a carbon nanotube (CNT) field emission electron ionization source, and an … JJ Amsden, PJ Herr, DMW Landry, W Kim, R Vyas, CB Parker, MP Kirley, ... Journal of The American Society for Mass Spectrometry 29 (2), 360-372, 2017 | 23 | 2017 |
| Improved performance of field emission vacuum microelectronic devices for integrated circuits EJ Radauscher, KH Gilchrist, ST Di Dona, ZE Russell, JR Piascik, ... IEEE Transactions on Electron Devices 63 (9), 3753-3760, 2016 | 21 | 2016 |
| Compatibility of spatially coded apertures with a miniature Mattauch-Herzog mass spectrograph ZE Russell, ST DiDona, JJ Amsden, CB Parker, G Kibelka, ME Gehm, ... Journal of The American Society for Mass Spectrometry 27 (4), 578-584, 2016 | 18 | 2016 |
| A miniature electron ionization source fabricated using microelectromechanical systems (MEMS) with integrated carbon nanotube (CNT) field emission cathodes and low-temperature … EJ Radauscher, CB Parker, KH Gilchrist, S Di Dona, ZE Russell, SD Hall, ... International Journal of Mass Spectrometry 422, 162-169, 2017 | 17 | 2017 |
| Coded apertures in mass spectrometry JJ Amsden, ME Gehm, ZE Russell, EX Chen, ST Di Dona, SD Wolter, ... Annual Review of Analytical Chemistry 10, 141-156, 2017 | 14 | 2017 |
| Effects of magnetic and electric field uniformity on coded aperture imaging quality in a cycloidal mass analyzer DMW Landry, W Kim, JJ Amsden, ST Di Dona, H Choi, L Haley, ... Journal of The American Society for Mass Spectrometry 29, 352-359, 2018 | 9 | 2018 |
| Inverse design tool for ion optical devices using the adjoint variable method LT Neustock, PC Hansen, ZE Russell, L Hesselink Scientific Reports 9 (1), 11031, 2019 | 7 | 2019 |
| Mass spectrometers having segmented electrodes and associated methods Z Russell, M Gehm, JT Glass, S Di Dona, E Chen, C Parker, J Amsden, ... US Patent 11,081,331, 2021 | 2 | 2021 |
| A novel sector mass spectrograph design for high-order coded aperture Mass Spectrometry with stigmatic aberration correction S DiDona, Z Russell, J Amsden, C Parker, J Glass, M Gehm International Journal of Mass Spectrometry 455, 116374, 2020 | 2 | 2020 |
| Coded Aperture Magnetic Sector Mass Spectrometry ZE Russell Duke University, 2015 | 2 | 2015 |
| Large Area Automated Deprocessing of Integrated Circuits: Present and Future EI Principe, ZE Russell, ST DiDona, M Therezien, BW Kempshall, ... EDFA Technical Articles 21 (3), 8-14, 2019 | 1 | 2019 |
| A high resolution miniature electron energy spectrometer S DiDona, Z Russell, J Glass, M Gehm Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2024 | | 2024 |
| Development of a Flexible Ensemble Classification System for Microscopy TJ McIntee, M Therezien, ZE Russell Microscopy and Microanalysis 28 (S1), 3036-3038, 2022 | | 2022 |
| Fast Automatic Point Spread Function Deconvolution Using Edge Detection ZE Russell, M Therezien, TJ McIntee, ST DiDona, JJ Haggen, EL Principe Microscopy and Microanalysis 28 (S1), 3076-3077, 2022 | | 2022 |
| Software Package for Efficient Creation of Training Data for Machine Learning Classifiers from Micrographs M Therezien, TJ McIntee, ZE Russell Microscopy and Microanalysis 28 (S1), 3082-3083, 2022 | | 2022 |
| Magnet assembly with improved field uniformity and methods of making and using same JJ Amsden, JT Glass, CB Parker, ME Gehm, Z Russell, D Landry, ... US Patent App. 16/206,800, 2019 | | 2019 |
| Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits EJ Radauscher, KH Gilchrist, ST Di Dona, ZE Russell, JR Piascik, ... 2015 IEEE International Electron Devices Meeting (IEDM), 33.2. 1-33.2. 4, 2015 | | 2015 |
| Development of a Micro Mass Spectrometer: Analysis of Particle Behavior in MEMS Ion Lens Systems Z Russell, PE Russell, J Glass, C Parker, B Stoner, K Gilchrist, J Piascik Microscopy and Microanalysis 15 (S2), 242-243, 2009 | | 2009 |
Jeffrey T. GlassDuke University在 duke.edu 的电子邮件经过验证
