| Tissue ablation by a free-electron laser tuned to the amide II band G Edwards, R Logan, M Copeland, L Reinisch, J Davidson, B Johnson, ... Nature 371 (6496), 416-419, 1994 | 358 | 1994 |
| Monte Carlo simulation of single event effects RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ... IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010 | 285 | 2010 |
| Radiotherapy in the presence of contrast agents: a general figure of merit and its application to gold nanoparticles SJ McMahon, MH Mendenhall, S Jain, F Currell Physics in Medicine & Biology 53 (20), 5635, 2008 | 231 | 2008 |
| Impact of low-energy proton induced upsets on test methods and rate predictions BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ... IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009 | 225 | 2009 |
| The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ... IEEE transactions on nuclear science 52 (6), 2125-2131, 2005 | 198 | 2005 |
| Muon-induced single event upsets in deep-submicron technology BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ... IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010 | 145 | 2010 |
| Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ... IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007 | 141 | 2007 |
| Multiple-bit upset in 130 nm CMOS technology AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ... IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006 | 140 | 2006 |
| Pulsed Tunable Monochromatic X-Ray Beams from a Compact Source: New Opportunities FE Carroll, MH Mendenhall, RH Traeger, C Brau, JW Waters American journal of roentgenology 181 (5), 1197-1202, 2003 | 120 | 2003 |
| An algorithm for computing screened Coulomb scattering in Geant4 MH Mendenhall, RA Weller Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2005 | 109 | 2005 |
| Effects of scaling on muon-induced soft errors BD Sierawski, RA Reed, MH Mendenhall, RA Weller, RD Schrimpf, ... 2011 International Reliability Physics Symposium, 3C. 3.1-3C. 3.6, 2011 | 98 | 2011 |
| System and method for producing pulsed monochromatic X-rays FE Carroll, RH Traeger, MH Mendenhall, JW Waters, G Edwards, CA Brau US Patent 6,687,333, 2004 | 96 | 2004 |
| Application of RADSAFE to Model the Single Event Upset Response of a 0.25 m CMOS SRAM KM Warren, RA Weller, BD Sierawski, RA Reed, MH Mendenhall, ... IEEE Transactions on Nuclear Science 54 (4), 898-903, 2007 | 93 | 2007 |
| Device-orientation effects on multiple-bit upset in 65 nm SRAMs AD Tipton, JA Pellish, JM Hutson, R Baumann, X Deng, A Marshall, ... IEEE Transactions on Nuclear Science 55 (6), 2880-2885, 2008 | 91 | 2008 |
| Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch KM Warren, BD Sierawski, RA Reed, RA Weller, C Carmichael, A Lesea, ... IEEE Transactions on Nuclear Science 54 (6), 2419-2425, 2007 | 91 | 2007 |
| Role of heavy-ion nuclear reactions in determining on-orbit single event error rates CL Howe, RA Weller, RA Reed, MH Mendenhall, RD Schrimpf, ... IEEE Transactions on Nuclear Science 52 (6), 2182-2188, 2005 | 91 | 2005 |
| A probability-conserving cross-section biasing mechanism for variance reduction in Monte Carlo particle transport calculations MH Mendenhall, RA Weller Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2012 | 90 | 2012 |
| Implications of nuclear reactions for single event effects test methods and analysis RA Reed, RA Weller, RD Schrimpf, MH Mendenhall, KM Warren, ... IEEE transactions on nuclear science 53 (6), 3356-3362, 2006 | 86 | 2006 |
| Electron-induced single-event upsets in static random access memory MP King, RA Reed, RA Weller, MH Mendenhall, RD Schrimpf, ... IEEE Transactions on Nuclear Science 60 (6), 4122-4129, 2013 | 82 | 2013 |
| Heavy ion testing and single event upset rate prediction considerations for a DICE flip-flop KM Warren, AL Sternberg, JD Black, RA Weller, RA Reed, ... IEEE Transactions on Nuclear Science 56 (6), 3130-3137, 2009 | 81 | 2009 |
