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Emerson Candido de Oliveira
Emerson Candido de Oliveira
System Engineer, LayTec AG
在 physik.uni-kl.de 的电子邮件经过验证
标题
引用次数
引用次数
年份
Characterization of the second-and third-order nonlinear optical susceptibilities of monolayer MoS2 using multiphoton microscopy
RI Woodward, RT Murray, CF Phelan, REP De Oliveira, TH Runcorn, ...
2D Materials 4 (1), 011006, 2016
1962016
Ultrafast charge transfer dynamics pathways in two-dimensional MoS 2–graphene heterostructures: a core-hole clock approach
Y Garcia-Basabe, AR Rocha, FC Vicentin, CEP Villegas, R Nascimento, ...
Physical Chemistry Chemical Physics 19 (44), 29954-29962, 2017
412017
Synthesis and characterization of pseudoboehmite and gamma-alumina
AH Munhoz, H de Paiva, LF de Miranda, EC De Oliveira, RC Andrades, ...
Materials Science Forum 820, 131-136, 2015
112015
Study of Gamma alumina synthesis–analysis of the specific surface area
AH Munhoz Jr, H De Paiva, L Figueiredo de Miranda, EC De Oliveira, ...
Advances in Science and Technology 87, 54-60, 2014
102014
Doped or quantum-dot layers as in situ etch-stop indicators for III/V semiconductor reactive ion etching (RIE) using reflectance anisotropy spectroscopy (RAS)
G Sombrio, E Oliveira, J Strassner, J Richter, C Doering, H Fouckhardt
Micromachines 12 (5), 502, 2021
72021
Interferometric in-situ III/V semiconductor dry-etch depth-control with±0.8 nm best accuracy using a quadruple-Vernier-scale measurement
G Sombrio, E Oliveira, J Strassner, C Doering, H Fouckhardt
Journal of Vacuum Science & Technology B 39 (5), 2021
62021
Reflectance anisotropy spectroscopy (RAS) for in-situ identification of roughness morphologies evolving during reactive ion etching (RIE)
E Oliveira, J Strassner, C Doering, H Fouckhardt
Applied Surface Science 611, 155769, 2023
32023
Optoelectrowetting (OEW) with push-actuation of microdroplets at small frequencies and OEW equations revisited
J Strassner, C Doering, E Oliveira, H Fouckhardt
Sensors and Actuators A: Physical 334, 113331, 2022
32022
Fabrication and characterization of silicon nitride waveguides for mid-infrared applications
EC de Oliveira, RM Gerosa, C Phelan, CJS de Matos
2019 SBFoton International Optics and Photonics Conference (SBFoton IOPC), 1-4, 2019
22019
Optimizing contact angle changes for droplet actuation by optoelectrowetting (OEW): A numerical multi-parameter analysis
E Oliveira, C Doering, H Fouckhardt
Sensors and Actuators A: Physical 365, 114835, 2024
12024
Reactive Ion Etching (RIE) Induced Surface Roughness Precisely Monitored In‐Situ and in Real Time by Reflectance Anisotropy Spectroscopy (RAS) in Combination with Principle …
E Oliveira, J Strassner, C Doering, H Fouckhardt
Advances in Materials Science and Engineering 2022 (1), 9747505, 2022
12022
Reflectance Anisotropy Spectroscopy (RAS) for Surface Roughness Morphology Identification During Reactive Ion Etching (RIE) of Monocrystalline III/V Semiconductors
E Oliveira
Verlag Dr. Hut, 2023
2023
Electronic Supplementary Information. Ultrafast charge transfer dynamics pathways in two dimensional MoS2-graphene heterostructures: A core hole clock approach.
Y Garcia-Basabe, AR Rocha, FC Vicentin, CE Villegas, R Nascimento, ...
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