| Scalable general high voltage MOSFET model including quasi-saturation and self-heating effects YS Chauhan, C Anghel, F Krummenacher, C Maier, R Gillon, B Bakeroot, ... Solid-state electronics 50 (11-12), 1801-1813, 2006 | 58 | 2006 |
| Compact modeling of lateral nonuniform doping in high-voltage MOSFETs YS Chauhan, F Krummenacher, R Gillon, B Bakeroot, MJ Declercq, ... IEEE Transactions on Electron Devices 54 (6), 1527-1539, 2007 | 52 | 2007 |
| Characterizing the TEM cell electric and magnetic field coupling to PCB transmission lines T Mandic, R Gillon, B Nauwelaers, A Baric IEEE Transactions on Electromagnetic Compatibility 54 (5), 976-985, 2012 | 49 | 2012 |
| Practical chip-centric electro-thermal simulations R Gillon, P Joris, H Oprins, B Vandevelde, A Srinivasan, R Chandra 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems …, 2008 | 31 | 2008 |
| An EKV-based high voltage MOSFET model with improved mobility and drift model YS Chauhan, R Gillon, B Bakeroot, F Krummenacher, M Declercq, ... Solid-State Electronics 51 (11-12), 1581-1588, 2007 | 29 | 2007 |
| Determining the reference impedance of on-wafer TLR calibrations on lossy substrates R Gillon, JP Raskin, D Vanhoenacker, JP Colinge 1996 26th European microwave conference 1, 170-173, 1996 | 27 | 1996 |
| A compact DC and AC model for circuit simulation of high voltage VDMOS transistor YS Chauhan, C Anghel, F Krummenacher, R Gillon, A Baguenier, ... 7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-114, 2006 | 21 | 2006 |
| New method for threshold voltage extraction of high-voltage MOSFETs based on gate-to-drain capacitance measurement C Anghel, B Bakeroot, YS Chauhan, R Gillon, C Maier, P Moens, ... IEEE electron device letters 27 (7), 602-604, 2006 | 16 | 2006 |
| Scaleable equivalent circuit modelling of the E-field coupling to microstrips in the TEM cell F Vanhee, J Catrysse, R Gillon, G Gielen 2008 International Symposium on Electromagnetic Compatibility-EMC Europe, 1-6, 2008 | 13 | 2008 |
| Impact of lateral nonuniform doping and hot carrier injection on capacitance behavior of high voltage MOSFETs YS Chauhan, R Gillon, M Declercq, AM Ionescu IETE Technical Review 25 (5), 244-250, 2008 | 8 | 2008 |
