| CMOS-compatible GaN-based devices on 200mm-Si for RF applications: Integration and Performance U Peralagu, A Alian, V Putcha, A Khaled, R Rodriguez, ... 2019 IEEE International Electron Devices Meeting (IEDM), 17.2. 1-17.2. 4, 2019 | 68 | 2019 |
| GaN-on-Si mm-wave RF Devices Integrated in a 200mm CMOS Compatible 3-Level Cu BEOL B Parvais, A Alian, U Peralagu, R Rodriguez, S Yadav, A Khaled, ... 2020 IEEE International Electron Devices Meeting (IEDM), 8.1. 1-8.1. 4, 2020 | 28 | 2020 |
| Substrate RF Losses and Non-linearities in GaN-on-Si HEMT Technology S Yadav, P Cardinael, M Zhao, K Vondkar, A Khaled, R Rodriguez, ... 2020 IEEE International Electron Devices Meeting (IEDM), 8.2. 1-8.2. 4, 2020 | 17 | 2020 |
| Investigating stress measurement capabilities of GHz Scanning Acoustic Microscopy for 3D failure analysis A Khaled, S Brand, M Kögel, T Appenroth, I De Wolf Microelectronics Reliability 64, 336-340, 2016 | 15 | 2016 |
| Buried metal line compatible with 3D sequential integration for top tier planar devices dynamic Vth tuning and RF shielding applications A Vandooren, Z Wu, A Khaled, J Franco, B Parvais, W Li, L Witters, ... 2019 Symposium on VLSI Technology, T56-T57, 2019 | 11 | 2019 |
| CMOS compatible GaN-on-Si HEMT technology for RF applications: Analysis of substrate losses and non-linearities S Yadav, P Cardinael, M Zhao, K Vondkar, U Peralagu, A Alian, A Khaled, ... 2021 International Conference on IC Design and Technology (ICICDT), 1-4, 2021 | 10 | 2021 |
| From 5G to 6G: will compound semiconductors make the difference? N Collaert, A Alian, A Banerjee, V Chauhan, RY ElKashlan, B Hsu, ... 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit …, 2020 | 10 | 2020 |
| Meta-materials approach to sensitivity enhancement of MEMS BAW resonant sensors X Rottenberg, R Jansen, V Cherman, A Witvrouw, HAC Tilmans, M Zanaty, ... SENSORS, 2013 IEEE, 1-4, 2013 | 10 | 2013 |
| (Plenary) The Revival of Compound Semiconductors and How They Will Change the World in a 5G/6G Era N Collaert, AR Alian, A Banerjee, V Chauhan, RY ElKashlan, B Hsu, ... ECS Transactions 98 (5), 15, 2020 | 8 | 2020 |
| Analysis of Gate-Metal Resistance in CMOS-Compatible RF GaN HEMTs RY ElKashlan, R Rodriguez, S Yadav, A Khaled, U Peralagu, A Alian, ... IEEE Transactions on Electron Devices 67 (11), 4592-4596, 2020 | 8 | 2020 |
| Failure and stress analysis of Cu TSVs using GHz-scanning acoustic microscopy and scanning infrared polariscopy I De Wolf, A Khaled, M Herms, M Wagner, T Djuric, P Czurratis, S Brand ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR …, 2015 | 8 | 2015 |
| Towards CMOS-compatible single-walled carbon nanotube resonators H Pathangi, V Cherman, A Khaled, B Sorée, G Groeseneken, A Witvrouw Microelectronic Engineering 107, 219-222, 2013 | 8 | 2013 |
| Advanced Transistors for High Frequency Applications B Parvais, U Peralagu, A Vais, AR Alian, L Witters, Y Mols, A Walke, ... ECS Transactions 97 (5), 27, 2020 | 6 | 2020 |
| mm-Wave GaN-on-Si HEMTs with a PSAT of 3.9W/mm at 28GHz R ElKashlan, A Khaled, S Yadav, H Yu, U Peralagu, AR Alian, N Collaert, ... 2023 IEEE/MTT-S International Microwave Symposium-IMS 2023, 24-27, 2023 | 5 | 2023 |
| Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer A Alian, R Rodriguez, S Yadav, U Peralagu, AS Hernandez, V Putcha, ... ESSDERC 2022-IEEE 52nd European Solid-State Device Research Conference …, 2022 | 5 | 2022 |
| Light-induced capacitance alteration for non-destructive fault isolation in TSV structures for 3-D integration KJP Jacobs, A Khaled, M Stucchi, T Wang, M Gonzalez, K Croes, ... International Symposium for Testing and Failure Analysis-ISTFA, 406-413, 2016 | 5 | 2016 |
| Detection of Local Cu-to-Cu Bonding Defects in Wafer-to-Wafer Hybrid Bonding using GHz-SAM I De Wolf, A Khaled, SW Kim, E Beyne, M Kogel, S Brand, ... Proceedings of the 44th International Symposium for Testing and Failure …, 2018 | 4 | 2018 |
| Acoustic and Photoacoustic inspection of Through-Silicon Vias in the GHz-frequency band S Brand, M Kögel, F Altmann, I DeWolf, A Khaled, MJ Moore, EM Strohm, ... ISTFA 2017: Proceedings from the 43rd International Symposium for Testing …, 2017 | 4 | 2017 |
| Effect of the functionalization process on the performance of SiGe MEM resonators used for bio-molecular sensing A Khaled, M Raoof, V Cherman, K Jans, M Abbas, S Ebrahim, G Bryce, ... Microelectronics Reliability 52 (9-10), 2272-2277, 2012 | 4 | 2012 |
| Linearity assessment of GaN HEMTs on Si using nonlinear characterisation R ElKashlan, A Khaled, R Rodriguez, V Putcha, U Peralagu, AR Alian, ... 2021 16th European Microwave Integrated Circuits Conference (EuMIC), 30-33, 2022 | 3 | 2022 |
