| A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations M Shen, G Li, D Wu, Y Yaguchi, JC Haley, KG Field, D Morgan Computational Materials Science 197, 110560, 2021 | 52 | 2021 |
| Multi defect detection and analysis of electron microscopy images with deep learning M Shen, G Li, D Wu, Y Liu, JRC Greaves, W Hao, NJ Krakauer, L Krudy, ... Computational Materials Science 199, 110576, 2021 | 50 | 2021 |
