| Topotactic Metal–Insulator Transition in Epitaxial SrFeOx Thin Films A Khare, D Shin, TS Yoo, M Kim, TD Kang, J Lee, S Roh, IH Jung, ... Advanced Materials 29 (37), 1606566, 2017 | 117 | 2017 |
| Optical properties of (GeTe, Sb2Te3) pseudobinary thin films studied with spectroscopic ellipsometry JW Park, SH Baek, TD Kang, H Lee, YS Kang, TY Lee, DS Suh, KJ Kim, ... Applied Physics Letters 93 (2), 2008 | 77 | 2008 |
| Dielectric functions and electronic band structure of lead zirconate titanate thin films H Lee, YS Kang, SJ Cho, B Xiao, H Morkoç, TD Kang, GS Lee, J Li, ... Journal of applied physics 98 (9), 2005 | 77 | 2005 |
| Mixing between and orbitals in NaIrO: A spectroscopic and density functional calculation study CH Sohn, HS Kim, TF Qi, DW Jeong, HJ Park, HK Yoo, HH Kim, JY Kim, ... Physical Review B—Condensed Matter and Materials Physics 88 (8), 085125, 2013 | 69 | 2013 |
| Effect of Ga∕ In ratio on the optical and electrical properties of GaInZnO thin films grown on SiO2∕ Si substrates D Kang, I Song, C Kim, Y Park, TD Kang, HS Lee, JW Park, SH Baek, ... Applied Physics Letters 91 (9), 2007 | 62 | 2007 |
| Microcrystalline silicon thin films studied using spectroscopic ellipsometry TD Kang, H Lee, SJ Park, J Jang, S Lee Journal of Applied Physics 92 (5), 2467-2474, 2002 | 56 | 2002 |
| Optical properties of black NiO and CoO single crystals studied with spectroscopic ellipsometry TD Kang, HS Lee, H Lee Journal of the Korean Physical Society 50 (3), 632-637, 2007 | 50 | 2007 |
| Temperature Evolution of Itinerant Ferromagnetism in Probed by Optical Spectroscopy DW Jeong, HC Choi, CH Kim, SH Chang, CH Sohn, HJ Park, TD Kang, ... Physical Review Letters 110 (24), 247202, 2013 | 44 | 2013 |
| Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability TN Stanislavchuk, TD Kang, PD Rogers, EC Standard, R Basistyy, ... Review of Scientific Instruments 84 (2), 2013 | 41 | 2013 |
| Coupling between magnon and ligand-field excitations in magnetoelectric garnet TD Kang, E Standard, KH Ahn, AA Sirenko, GL Carr, S Park, YJ Choi, ... Physical Review B—Condensed Matter and Materials Physics 82 (1), 014414, 2010 | 38 | 2010 |
| Suppression of three-dimensional charge density wave ordering via thickness control G Kim, M Neumann, M Kim, MD Le, TD Kang, TW Noh Physical Review Letters 115 (22), 226402, 2015 | 35 | 2015 |
| Large electro-optic effect in single-crystal Pb (Zr, Ti) O3 (001) measured by spectroscopic ellipsometry TD Kang, B Xiao, V Avrutin, Ü Özgür, H Morkoç, JW Park, HS Lee, H Lee, ... Journal of Applied Physics 104 (9), 2008 | 25 | 2008 |
| Adjusted oscillator strength matching for hybrid magnetic and electric excitations in DyFeO garnet PD Rogers, YJ Choi, EC Standard, TD Kang, KH Ahn, A Dubroka, ... Physical Review B—Condensed Matter and Materials Physics 83 (17), 174407, 2011 | 24 | 2011 |
| High quality epitaxial growth of PbTiO3 by molecular beam epitaxy using H2O2 as the oxygen source X Gu, N Izyumskaya, V Avrutin, H Morkoç, TD Kang, H Lee Applied physics letters 89 (12), 2006 | 22 | 2006 |
| Visible-ultraviolet spectroscopic ellipsometry of lead zirconate titanate thin films H Lee, YS Kang, SJ Cho, B Xiao, H Morkoç, TD Kang Applied Physics Letters 86 (26), 2005 | 22 | 2005 |
| Mueller matrices for anisotropic metamaterials generated using 4× 4 matrix formalism PD Rogers, TD Kang, T Zhou, M Kotelyanskii, AA Sirenko Thin Solid Films 519 (9), 2668-2673, 2011 | 21 | 2011 |
| Far-infrared spectra of the magnetic exchange resonances and optical phonons and their connection to magnetic and dielectric properties of DyFeO garnet TD Kang, EC Standard, PD Rogers, KH Ahn, AA Sirenko, A Dubroka, ... Physical Review B—Condensed Matter and Materials Physics 86 (14), 144112, 2012 | 20 | 2012 |
| Ellipsometry on uniaxial ZnO and Zn1− xMgxO thin films grown on (0001) sapphire substrate TD Kang, H Lee, WI Park, GC Yi Thin Solid Films 455, 609-614, 2004 | 19 | 2004 |
| Optical spectroscopy of the carrier dynamics in LaVO/SrVO superlattices DW Jeong, WS Choi, TD Kang, CH Sohn, A David, H Rotella, AA Sirenko, ... Physical Review B—Condensed Matter and Materials Physics 84 (11), 115132, 2011 | 17 | 2011 |
| Optical properties of SiO2/nanocrystalline Si multilayers studied using spectroscopic ellipsometry KJ Lee, TD Kang, H Lee, SH Hong, SH Choi, TY Seong, KJ Kim, ... Thin Solid Films 476 (1), 196-200, 2005 | 17 | 2005 |
HOSUN LEEKyung Hee University在 khu.ac.kr 的电子邮件经过验证
