S Wang, G Zhang, J Wei, Y Wang, J Wu… - Proceedings of the 29th …, 2023 - dl.acm.org
Silent Data Corruption (SDC) in processors can lead to various application-level issues, such as incorrect calculations and even data loss. Since traditional techniques are not …
SKS Hari, SV Adve, H Naeimi - IEEE/IFIP international …, 2012 - ieeexplore.ieee.org
With technology scaling, transient faults are becoming an increasing threat to hardware reliability. Commodity systems must be made resilient to these in-field faults through very …
Next-generation supercomputers are expected to have more components and, at the same time, consume several times less energy per operation. Consequently, the number of soft …
As technology scales to lower feature sizes, devices become more susceptible to soft errors. Soft errors can lead to silent data corruptions (SDCs), seriously compromising the reliability …
Exponentially growing rate of soft errors makes reliability a major concern in modern processor design. Since software-oriented approaches offer flexible protection even in off …
This paper presents IPAS, an instruction duplication technique that protects scientific applications from silent data corruption (SDC) in their output. The motivation for IPAS is that …
A Thomas, K Pattabiraman - 2013 43rd Annual IEEE/IFIP …, 2013 - ieeexplore.ieee.org
The scaling of Silicon devices has exacerbated the unreliability of modern computer systems, and power constraints have necessitated the involvement of software in hardware …
A Chatzidimitriou, P Bodmann… - 2019 49th Annual …, 2019 - ieeexplore.ieee.org
Fault injection in early microarchitecture-level simulation CPU models and beam experiments on the final physical CPU chip are two established methodologies to access the …
Y Tian, B Ray - Proceedings of the 2017 11th joint meeting on …, 2017 - dl.acm.org
Correct error handling is essential for building reliable and secure systems. Unfortunately, low-level languages like C often do not support any error handling primitives and leave it up …