The vulnerability of the current and future processors towards transient errors caused by
particle strikes is expected to increase rapidly because of exponential growth rate of on-chip …

Current transients caused by energetic particle strikes are a serious threat for digital circuits
in aerospace applications. Such single-event transients (SETs) can corrupt the circuit state …

The continuing decrease in dimensions and operating voltage of transistors has increased
their sensitivity against radiation phenomena making soft errors an important challenge in …

Cosmic radiation induced soft errors have emerged as a key challenge in computer system
design. The exponential increase in the transistor count will drive the per chip fault rate sky …

Due to technology scaling, which means smaller transistor, lower voltage and more
aggressive clock frequency, VLSI devices are becoming more susceptible against soft …

This work presents the application of a recomputing-based correction technique to mitigate
radiation effects on integrated processors. The recomputing process is associated to bulk …

The trend of downsizing transistors and operating voltage scaling has made the processor
chip more sensitive against radiation phenomena making soft errors an important challenge …

As transistor geometry shrinks, the erroneous and spurious charge from a particle strike
tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU …

As device feature size continues to scale down to the nanometer regime, the decreasing
critical charge fundamentally reduces noise margins of devices and in turn increases the …

The effect of single-event transients (SETs)(at a combinational node of a design) on the
system reliability is becoming a big concern for ICs manufactured using advanced …