Steady‐state photocarrier grating technique for diffusion length measurement in photoconductive insulators

D Ritter, E Zeldov, K Weiser - Applied physics letters, 1986 - pubs.aip.org
A new simple technique for the determination of the diffusion length in photoconductive
insulators is presented. A steady-state photocarrier grating is created by two interfering laser …

Self‐consistency and self‐sufficiency of the photocarrier grating technique

I Balberg, AE Delahoy, HA Weakliem - Applied physics letters, 1988 - pubs.aip.org
The recently suggested photocarrier grating technique appears to be the most reliable
method available for the determination of the ambipolar diffusion length in hydrogenated …

Steady‐state photocarrier grating technique for diffusion‐length measurement in semiconductors: Theory and experimental results for amorphous silicon and semi …

D Ritter, K Weiser, E Zeldov - Journal of applied physics, 1987 - pubs.aip.org
The theory underlying the steady-state photocarrier grating technique is presented,
including the effect of surface recombination. Experimental results for amorphous …

Theory of the steady-state-photocarrier-grating technique for obtaining accurate diffusion-length measurements in amorphous silicon

K Hattori, H Okamoto, Y Hamakawa - Physical Review B, 1992 - APS
This paper presents a theory that is the basis of the steady-state-photocarrier-grating (SSPG)
technique, as a means of determining the diffusion length of photocarriers in amorphous …

Measurement of carrier lifetimes in germanium and silicon

DT Stevenson, RJ Keyes - Journal of Applied Physics, 1955 - pubs.aip.org
The decay of photoconductivity has been used to measure the lifetime of excess carriers in
rectangular samples of germanium and silicon. The sample is illuminated by a short pulse of …

Analysis of the moving-photocarrier-grating technique for the determination of mobility and lifetime of photocarriers in semiconductors

U Haken, M Hundhausen, L Ley - Physical Review B, 1995 - APS
We describe a technique for the determination of the carrier lifetime (τ) and the carrier
mobilities (μ n, μ p) in semiconductors, namely the moving-photocarrier-grating method. This …

Range of validity of the surface‐photovoltage diffusion length measurement: A computer simulation

PJ McElheny, JK Arch, HS Lin, SJ Fonash - Journal of Applied Physics, 1988 - pubs.aip.org
The surface‐photovoltage diffusion length measurement is analyzed in depth to determine
its range of applicability and cause of failure when it no longer yields the diffusion length. It is …

Carrier diffusion in amorphous semiconductors

JM Marshall - Reports on Progress in Physics, 1983 - iopscience.iop.org
The increasing use of amorphous semiconducting films in various commercial applications
has stimulated considerable interest in the electronic transport properties of such materials …

Determination of localized‐state distributions in amorphous semiconductors from transient photoconductivity

H Naito, J Ding, M Okuda - Applied physics letters, 1994 - pubs.aip.org
Various spectroscopic techniques for determination of localized-state distributions have
been reported,* and the most widely used methods are the modulated photocurrent2-4 and …

Ambipolar transport in amorphous semiconductors in the lifetime and relaxation-time regimes investigated by the steady-state photocarrier grating technique

D Ritter, E Zeldov, K Weiser - Physical Review B, 1988 - APS
The ambipolar-transport equations including space-charge effects are solved for the case of
a sinusoidal generation of photocarriers in amorphous semiconductors. In the ''lifetime …