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Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, AE Naciri, L Johann - Optics express, 2008 - opg.optica.org
The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …
被引用次数：52 相关文章

Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, AE Naciri, L Johann - Optics express, 2008 - pubmed.ncbi.nlm.nih.gov
The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …

[引用][C] Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, AE Naciri, L Johann - Optics Express, 2008 - cir.nii.ac.jp
Systematic errors for a Mueller matrix dual rotating compensator ellipsometer | CiNii Research
CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …

[引用][C] Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, AE Naciri, L Johann - Optics Express, 2008 - hal.science
Systematic errors for a Mueller matrix dual rotating compensator ellipsometer - Archive ouverte
HAL Accéder directement au contenu Documentation FR Français (FR) Anglais (EN) Se …
[PDF] researchgate.net

[PDF][PDF] Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, AE Naciri, L Johann - 2008 - researchgate.net
The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …

[引用][C] Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, A En Naciri, L Johann - Optics Express, 2008 - ui.adsabs.harvard.edu
Systematic errors for a Mueller matrix dual rotating compensator ellipsometer - NASA/ADS
Now on home page ads icon ads Enable full ADS view NASA/ADS Systematic errors for a …

Systematic errors for a Mueller matrix dual rotating compensator ellipsometer.

L Broch, E Naciri, L Johann - Optics Express, 2008 - europepmc.org
The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …

[引用][C] Systematic errors for a Mueller matrix dual rotating compensator ellipsometer

L Broch, AE Naciri, L Johann - Optics Express, 2008 - hal.univ-lorraine.fr
Systematic errors for a Mueller matrix dual rotating compensator ellipsometer - Université de
Lorraine Accéder directement au contenu Documentation FR Français (FR) Anglais (EN) Se …