Dual-rotating compensator Mueller matrix ellipsometer (DRC-MME) has been designed and
applied as a powerful tool for the characterization of thin films and nanostructures. The …

We investigate the systematic errors at the second order for a Mueller matrix ellipsometer in
the dual rotating compensator configuration. Starting from a general formalism, we derive …

To reduce the error induced by light source fluctuations, motor rotation instability,
environment, and other factors in real-time measurements using dual-rotating compensator …

The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …

A focusing lens consisting of two or more elements is widely used in ellipsometers for spatial
resolution. In a typical ellipsometer layout, a lens is placed before the sample to focus light …

Ever since the dual-rotating compensator Mueller matrix ellipsometer (DRC-MME) was
developed, improving its measurement accuracy has been an important research topic …

Noticeable depolarization effects are observed in the measurement of the air using an in-
house developed dual rotating-compensator Mueller matrix ellipsometer. We demonstrate …

Due to the instability of motor speeds, asynchrony in trigger systems, and mechanical
factors, the use of continuous dual-rotating compensator (DRC)-Mueller matrix ellipsometer …

The random noise and the systematic errors caused by azimuthal errors of the optical
elements, ie, the polarizer, the analyzer, or the compensator, would lead to measurement …

Composite waveplates consisting of two or more single waveplates are widely used in
optical instruments, such as ellipsometry, polarimetry, cryptography, and photoelasticity …