Development and Calibration of a Vertical High-Speed Mueller Matrix Ellipsometer

J Liu, S Zhang, B Deng, L Li, H Gu, J Zhu, H Jiang… - Photonics, 2023 - mdpi.com
In order to meet the requirements of dynamic monitoring from a bird's eye view for typical
rapidly changing processes such as mechanical rotation and photoresist exposure reaction …

[PDF][PDF] Development of instrumentation for Mueller matrix ellipsometry

F Stabo-Eeg - 2009 - ntnuopen.ntnu.no
This thesis gives an introduction to the Mueller-Stokes calculus, which is used to describe
partially and fully polarized light. It describes how polarized light interacts with various …

Dual vortex retarder Mueller matrix ellipsometry

C Gao, F Wang, X Wen, J Weng, X Cao, B Lei - Optics and Lasers in …, 2023 - Elsevier
We propose a dual vortex retarder Mueller matrix ellipsometry (DVRMME) that can extract
16 Mueller matrix elements by analyzing a single intensity image. Two customized vortex …

Complete Mueller matrix measurement with a single high frequency modulation

E Compain, B Drevillon, J Huc, JY Parey, JE Bouree - Thin Solid Films, 1998 - Elsevier
A new Mueller matrix ellipsometer (MME) is presented. It provides the simultaneous
measurement of the 16 Mueller matrix coefficients in four modulation periods (80 μs under …

The ultimate in real-time ellipsometry: Multichannel Mueller matrix spectroscopy

C Chen, MW Horn, S Pursel, C Ross, RW Collins - Applied surface science, 2006 - Elsevier
A review of the techniques and applications of multichannel ellipsometry in the dual-rotating-
compensator configuration is given. This ellipsometric approach has been established as …

Calibration of residual polarization in light source for broadband rotating polarizer spectroscopic ellipsometer

M Gong, H Gu, C Chen, J Chen, W Li, C Zhang, S Liu - Thin Solid Films, 2023 - Elsevier
The rotating polarizer spectroscopic ellipsometer (RPSE) has many advantages, such as
simple optical configuration and broadband achromatism. However, the final performances …

Measurement of layer thicknesses with an improved optimization method for depolarizing Mueller matrices

T Grunewald, M Wurm, S Teichert… - Measurement …, 2020 - iopscience.iop.org
There are some commonly-used optimization techniques for the analysis of measured data
in spectroscopic Mueller matrix ellipsometry (MME) used, for example, to calculate the layer …

Design of a spectroscopic ellipsometer by synchronous rotation of the polarizer and analyzer in opposite directions

TM El‐Agez, SA Taya - Microwave and Optical Technology …, 2014 - Wiley Online Library
In this article, a spectroscopic ellipsometer is constructed in rotating polarizer and analyzer
configuration. Instead of continuous rotation and integration for waveform analysis, a step …

Mueller matrix ellipsometry study of a circular polarizing filter

N Hong, JN Hilfiker - Journal of Vacuum Science & Technology B, 2020 - pubs.aip.org
The authors introduce an ellipsometric data analysis strategy for a flexible polymeric circular
polarizing filter consisting of a thin linear polarizer and quarter-wave plate sandwich. The …

Optimal configuration of partial Mueller matrix polarimeter for measuring the ellipsometric parameters in the presence of Poisson shot noise and Gaussian noise

N Quan, C Zhang, T Mu - Photonics and Nanostructures-Fundamentals and …, 2018 - Elsevier
We address the optimal configuration of a partial Mueller matrix polarimeter used to
determine the ellipsometric parameters in the presence of additive Gaussian noise and …