We report a new (to the best of our knowledge) ellipsometric measurement scheme called
spatially polarization-modulated ellipsometry (SPME), which is based on the vectorial optical …

A dual rotating-compensator Mueller matrix ellipsometer has been designed and
constructed to carry out film thickness measurements on rough substrates. Measurements …

We describe a spectroscopic ellipsometer in the visible domain (400–800 nm) based on a
rotating compensator technology using two detectors. The classical analyzer is replaced by …

A new ellipsometer is described that uses two photoelastic modulator–polarizer pairs, where
the photoelastic modulators are operating at differing resonant frequencies. The time …

Ellipsometer is a powerful tool to determine the thickness and optical properties of thin films.
Usually, traditional spectroscopic ellipsometer employing Tran missive lenses for beam …

The application of rotating-compensator ellipsometry (RCE) to measurements of the system
Mueller matrix M of linear optical systems is reported. This technique extends a previously …

The object of ellipsometry is to determine the complex ratio ρ (ρ= tanifi exp (i&)) of the
reflected or transmitted polarization state parameters. Ellipsometry has traditionally been …

A rotating-compensator multichannel ellipsometer has been developed for ultraviolet-
extended real time operation over the spectral range from 1.5 to 6.5 eV. The enhancements …

A new method of aligning the optical components has been proposed for the polarizer–
specimen–compensator–analyzer ellipsometer configuration. By carrying out the …

A polarization modulation (PM) imaging ellipsometer is proposed and setup in order to
measure precisely the thickness of thin film. Five images are collected sequentially by CCD …