Two modulator generalized ellipsometer for complete Mueller matrix measurement

GE Jellison Jr, FA Modine - US Patent 5,956,147, 1999 - Google Patents
57 ABSTRACT A two-modulator generalized ellipsometer (2-MGE) com prising two polarizer-
photoelastic modulator (PEM) pairs, an optical light Source, an optical detection System, and …

Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers

DE Aspnes - JOSA A, 2004 - opg.optica.org
I investigate the dependence of shot-noise-limited uncertainties of the ellipsometric
parameters ψ and Δ for the rotating-analyzer ellipsometer (RAE) and the rotating …

Calibration of the retardation inhomogeneity for the compensator-rotating imaging ellipsometer

L Jin, Y Iizuka, T Iwao, E Kondoh, M Uehara… - Applied Optics, 2019 - opg.optica.org
Owing to high accuracy in the whole measurement range, the compensator-rotating method
is a main approach for the single-point ellipsometric measurement. The disadvantage of this …

Optimal Measurement Matrix of Partial Polarimeter for Measuring Ellipsometric Parameters With Eight Intensity Measurements

X Li, H Hu, H Wang, T Liu - IEEE Access, 2019 - ieeexplore.ieee.org
We demonstrate that the ellipsometric parameters of the isotropic samples can be measured
by a partial polarimeter with only eight intensity measurements. Under the Gaussian and …

Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films

J Lee, J Koh, RW Collins - Optics letters, 2000 - opg.optica.org
A multichannel ellipsometer in the dual-rotating-compensator configuration has been
developed for potential applications in real-time Mueller matrix spectroscopy of anisotropic …

Real Time Characterization of Non-Ideal Surfaces and Thin Film Growth by Advanced Ellipsometric Spectroscopies

RW Collins, PI Rovira, AS Ferlauto, J Koh… - MRS Online …, 1999 - cambridge.org
The development of multichannel ellipsometers with photodiode array-based detection
systems has enabled real time spectroscopic ellipsometry (SE), a technique now being used …

The fixed-polarizer nulling scheme in generalized ellipsometry

RMA Azzam, TL Bundy, NM Bashara - Optics Communications, 1973 - Elsevier
In the polarizer-compensator-system-analyzer (PCSA) ellipsometer arrangement the nulling
scheme in which P is set and C and A are adjusted for null provides the largest number of …

Some aspects on the uncertainty calculation in Mueller ellipsometry

M Wurm, T Grunewald, S Teichert, B Bodermann… - Optics express, 2020 - opg.optica.org
In this paper, we focus on the metrological aspects of spectroscopic Mueller ellipsometry—ie
on the uncertainty estimation of the measurement results. With the help of simulated Mueller …

Imaging ellipsometer with large field-of-view

L Gu, A Zeng, S Hu, Q Yuan, W Cheng… - … and Inspection for …, 2016 - spiedigitallibrary.org
A polarizer-compensator-sample-analyzer (PCSA) imaging ellipsometer with large field of
view is presented. The sample is imaged on a CCD sensor by a telecentric imaging system …

[引用][C] Study on LM algorithm in Mueller's ellipsometry calibration method

G Yuqing, T Dongmei, F Yunxia, S Jiayuan… - 红外与激光 …, 2020 - 红外与激光工程